@article{PrumeRaederTyholdtetal.2007,
  author    = {Prume, Klaus and Raeder, H. and Tyholdt, F. and Booij, W. E.},
  title     = {Taking piezoelectric microsystems from the laboratory to production / Raeder, H. ; Tyholdt, F. ; Booij, W. ; Calame, F. ; Ostbo, N. P. ; Bredesen, R. ; Prume, K. ; Rijnders, G. ; Muralt, P.},
  series = {Journal of Electroceramics. 19 (2007), H. 4},
  journal   = {Journal of Electroceramics. 19 (2007), H. 4},
  isbn      = {1385-3449},
  pages     = {357 -- 362},
  year      = {2007},
  language  = {en}
}
@article{PrumeZalachasLaskewitzetal.2008,
  author    = {Prume, Klaus and Zalachas, Nicolas and Laskewitz, Bernd and Kamlah, Marc},
  title     = {Effective Piezoelectric Coefficients of Ferroelectric Thin Films on Elastic Substrates / Zalachas, Nicolas ; Laskewitz, Bernd ; Kamlah, Marc ; Prume, Klaus ; Lapusta, Yuri ; Tiedke, Stephan},
  series = {Journal of Intelligent Material Systems and Structures. 20 (2008), H. 6},
  journal   = {Journal of Intelligent Material Systems and Structures. 20 (2008), H. 6},
  isbn      = {1045-389X},
  pages     = {683 -- 695},
  year      = {2008},
  language  = {en}
}
@article{PrumeMuraltCalameetal.2007,
  author    = {Prume, Klaus and Muralt, Paul and Calame, Florian and Schmitz-Kempen, Thorsten},
  title     = {Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals / Prume, Klaus ; Muralt, Paul ; Calame, Florian ; Schmitz-Kempen, Thorsten ; Tiedke, Stephan},
  series = {Journal of Electroceramics. 19 (2007), H. 4},
  journal   = {Journal of Electroceramics. 19 (2007), H. 4},
  isbn      = {1385-3449},
  pages     = {407 -- 411},
  year      = {2007},
  language  = {en}
}
@article{PrumeBooijVogletal.2007,
  author    = {Prume, Klaus and Booij, W. E. and Vogl, A. H. and Wang, D. T.},
  title     = {A simple and powerful analytical model for MEMS piezoelectric multimorphs / Booij, W. E. ; Vogl, A. H. ; Wang, D. T. ; Tyholdt, F. ; Ostbo, N. P. ; Raeder, H. ; Prume, K.},
  series = {Journal of Electroceramics. 19 (2007), H. 4},
  journal   = {Journal of Electroceramics. 19 (2007), H. 4},
  isbn      = {1385-3449},
  pages     = {387 -- 393},
  year      = {2007},
  language  = {en}
}
@article{PrumeTyholdtCalameetal.2007,
  author    = {Prume, Klaus and Tyholdt, F. and Calame, F. and Raeder, H.},
  title     = {Chemically derived seeding layer for {100}-textured PZT thin films / Tyholdt, F. ; Calame, F. ; Prume, K. ; Raeder, H. ; Muralt, P.},
  series = {Journal of Electroceramics. 19 (2007), H. 4},
  journal   = {Journal of Electroceramics. 19 (2007), H. 4},
  isbn      = {1385-3449},
  pages     = {311 -- 314},
  year      = {2007},
  language  = {en}
}
@article{PrumeFrankenBoettgeretal.2002,
  author    = {Prume, Klaus and Franken, Klaus and B{\"o}ttger, Ulrich and Waser, Rainer},
  title     = {Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; B{\"o}ttger, Ulrich ; Waser, Rainer ; Maier, Horst R.},
  series = {Journal of the European Ceramic Society. 22 (2002), H. 8},
  journal   = {Journal of the European Ceramic Society. 22 (2002), H. 8},
  isbn      = {0955-2219},
  pages     = {1285 -- 1296},
  year      = {2002},
  language  = {en}
}
@article{PrumeRoelofsSchmitzetal.2002,
  author    = {Prume, Klaus and Roelofs, Andreas and Schmitz, Thorsten and Reichenberg, Bernd},
  title     = {Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb},
  series = {Japanese Journal of Applied Physics. 41 (2002), H. 11B},
  journal   = {Japanese Journal of Applied Physics. 41 (2002), H. 11B},
  isbn      = {0021-4922},
  pages     = {7198 -- 7201},
  year      = {2002},
  language  = {en}
}
@article{PrumeMeyerWaseretal.2005,
  author    = {Prume, Klaus and Meyer, Ren{\´e} and Waser, Rainer and Schmitz, Torsten},
  title     = {Dynamic leakage current compensation in ferroelectric thin-film capacitor structures / Meyer, Ren{\´e} ; Waser, Rainer ; Prume, Klaus ; Schmitz, Torsten ; Tiedke, Stephan},
  series = {Applied Physics Letters . 86 (2005), H. 14},
  journal   = {Applied Physics Letters . 86 (2005), H. 14},
  isbn      = {0003-6951},
  pages     = {142907-1 -- 142907-3},
  year      = {2005},
  language  = {en}
}
@article{PrumeFrankenMaieretal.2000,
  author    = {Prume, Klaus and Franken, Klaus and Maier, Horst R. and Waser, Rainer},
  title     = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer},
  series = {Journal of the American Ceramic Society. 83 (2000), H. 6},
  journal   = {Journal of the American Ceramic Society. 83 (2000), H. 6},
  isbn      = {0002-7820},
  pages     = {1433 -- 1440},
  year      = {2000},
  language  = {en}
}
@article{PrumeWaserFrankenetal.2000,
  author    = {Prume, Klaus and Waser, Rainer and Franken, Klaus and Maier, Horst R.},
  title     = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;},
  series = {Journal of the American Ceramic Society. 83 (2000), H. 5},
  journal   = {Journal of the American Ceramic Society. 83 (2000), H. 5},
  isbn      = {0002-7820},
  pages     = {1153 -- 1159},
  year      = {2000},
  language  = {en}
}