Growth-induced interface roughness of GaAs/AlAs-layers studied by X-ray scattering under grazing angles / U. Klemradt ; M. Funke ; M. Fromm ... A Förster
| Author: | Arnold Förster, U. Klemradt, M. Funke, M Fromm |
|---|---|
| ISBN: | 0921-4526 |
| Parent Title (English): | Physica B: condensed matter. 221 (1996), H. 1-4 |
| Document Type: | Article |
| Language: | English |
| Year of Completion: | 1996 |
| Date of the Publication (Server): | 2012/12/18 |
| First Page: | 27 |
| Last Page: | 33 |
| Link: | http://dx.doi.org/0921-4526(95)00901-9 |
| Zugriffsart: | bezahl |
| Institutes: | FH Aachen / Fachbereich Energietechnik |
