Atomic scale strain measurements by the digital analysis of transmission electron microscopic lattice images / A. Rosenauer ; T. Remmele ; D. Gerthsen ... A. Förster

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Metadaten
Author:Arnold Förster, A. Rosenauer, T. Remmele
ISBN:0030-4026
Parent Title (English):Optik : international journal for light and electron optics. 105 (1997), H. 3
Document Type:Article
Language:English
Year of Completion:1997
Date of the Publication (Server):2012/12/18
First Page:99
Last Page:107
Institutes:FH Aachen / Fachbereich Energietechnik