LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements
| Author: | Holger HeuermannORCiD |
|---|---|
| Document Type: | Article |
| Language: | English |
| Year of Completion: | 1995 |
| Date of the Publication (Server): | 2012/12/18 |
| First Page: | 129 |
| Last Page: | 136 |
| Note: | 45th ARFTG Conference digest, Spring 1995 : [conference topic: Testing and design of RFIC'S], May 19, 1995, Orange County Convention Center, Orlando, Florida / Automatic RF Techniques Group. Publications chairman: Ed Godshalk; ARFTG Conference digest ; 4 |
| Link: | http://dx.doi.org/10.1109/ARFTG.1995.327116 |
| Zugriffsart: | campus |
| Institutes: | FH Aachen / Fachbereich Elektrotechnik und Informationstechnik |
