TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - The double-LNN Calibration technique for scattering parameter measurements of microstrip devices
T2  - Conference proceedings
Y1  - 1995
UR  - https://opus.bibliothek.fh-aachen.de/opus4/frontdoor/index/index/docId/465
N1  - European Microwave Conference <25, 1995, Bologna>
SP  - 343
EP  - 347
PB  - NEXUS House
CY  - Kent
ER  -