TY  - JOUR
A1  - Heuermann, Holger
T1  - LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements
Y1  - 1995
UR  - https://opus.bibliothek.fh-aachen.de/opus4/frontdoor/index/index/docId/466
N1  - 45th ARFTG Conference digest, Spring 1995 : [conference topic: Testing and design of RFIC'S], May 19, 1995, Orange County Convention Center, Orlando, Florida / Automatic RF Techniques Group. Publications chairman: Ed Godshalk;  ARFTG Conference digest ; 4
SP  - 129
EP  - 136
ER  -