TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique
T2  - Conference proceedings : [Palais des Festivals et des Congrès Cannes, France, 5 - 8 September 1994]
Y1  - 1994
UR  - https://opus.bibliothek.fh-aachen.de/opus4/frontdoor/index/index/docId/464
SN  - 0-9518032-5-5
N1  - European Microwave Conference <24, 1994, Cannes>
PB  - Nexus Business Communications
CY  - Swanley
ER  -