TY  - JOUR
A1  - Prume, Klaus
A1  - Tiedke, S.
A1  - Schmitz, T.
A1  - Roelofs, A.
T1  - Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs
T2  - Applied Physics Letters. 79 (2001), H. 22
Y1  - 2001
UR  - https://opus.bibliothek.fh-aachen.de/opus4/frontdoor/index/index/docId/4049
SN  - 0003-6951
SP  - 3678
EP  - 3680
ER  -