TY  - JOUR
A1  - Scherer, Ulrich W.
T1  - Controlled ion track etching / J. George;  M. Irkens ;  S. Neumann ;  U. W. Scherer ;  A. Srivastava ;  D. Sinha ; D. Fink
T2  - Radiation Effects and Defects in Solids. 161 (2006), H. 3
Y1  - 2006
UR  - https://opus.bibliothek.fh-aachen.de/opus4/frontdoor/index/index/docId/3248
SP  - 161
EP  - 175
ER  -