@article{PrumeBooijVogletal.2007,
  author    = {Prume, Klaus and Booij, W. E. and Vogl, A. H. and Wang, D. T.},
  title     = {A simple and powerful analytical model for MEMS piezoelectric multimorphs / Booij, W. E. ; Vogl, A. H. ; Wang, D. T. ; Tyholdt, F. ; Ostbo, N. P. ; Raeder, H. ; Prume, K.},
  series = {Journal of Electroceramics. 19 (2007), H. 4},
  journal   = {Journal of Electroceramics. 19 (2007), H. 4},
  isbn      = {1385-3449},
  pages     = {387 -- 393},
  year      = {2007},
  language  = {en}
}
@article{PrumeTyholdtCalameetal.2007,
  author    = {Prume, Klaus and Tyholdt, F. and Calame, F. and Raeder, H.},
  title     = {Chemically derived seeding layer for {100}-textured PZT thin films / Tyholdt, F. ; Calame, F. ; Prume, K. ; Raeder, H. ; Muralt, P.},
  series = {Journal of Electroceramics. 19 (2007), H. 4},
  journal   = {Journal of Electroceramics. 19 (2007), H. 4},
  isbn      = {1385-3449},
  pages     = {311 -- 314},
  year      = {2007},
  language  = {en}
}
@article{PrumeFrankenBoettgeretal.2002,
  author    = {Prume, Klaus and Franken, Klaus and B{\"o}ttger, Ulrich and Waser, Rainer},
  title     = {Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; B{\"o}ttger, Ulrich ; Waser, Rainer ; Maier, Horst R.},
  series = {Journal of the European Ceramic Society. 22 (2002), H. 8},
  journal   = {Journal of the European Ceramic Society. 22 (2002), H. 8},
  isbn      = {0955-2219},
  pages     = {1285 -- 1296},
  year      = {2002},
  language  = {en}
}
@article{PrumeRoelofsSchmitzetal.2002,
  author    = {Prume, Klaus and Roelofs, Andreas and Schmitz, Thorsten and Reichenberg, Bernd},
  title     = {Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb},
  series = {Japanese Journal of Applied Physics. 41 (2002), H. 11B},
  journal   = {Japanese Journal of Applied Physics. 41 (2002), H. 11B},
  isbn      = {0021-4922},
  pages     = {7198 -- 7201},
  year      = {2002},
  language  = {en}
}
@article{PrumeMeyerWaseretal.2005,
  author    = {Prume, Klaus and Meyer, Ren{\´e} and Waser, Rainer and Schmitz, Torsten},
  title     = {Dynamic leakage current compensation in ferroelectric thin-film capacitor structures / Meyer, Ren{\´e} ; Waser, Rainer ; Prume, Klaus ; Schmitz, Torsten ; Tiedke, Stephan},
  series = {Applied Physics Letters . 86 (2005), H. 14},
  journal   = {Applied Physics Letters . 86 (2005), H. 14},
  isbn      = {0003-6951},
  pages     = {142907-1 -- 142907-3},
  year      = {2005},
  language  = {en}
}
@article{PrumeFrankenMaieretal.2000,
  author    = {Prume, Klaus and Franken, Klaus and Maier, Horst R. and Waser, Rainer},
  title     = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer},
  series = {Journal of the American Ceramic Society. 83 (2000), H. 6},
  journal   = {Journal of the American Ceramic Society. 83 (2000), H. 6},
  isbn      = {0002-7820},
  pages     = {1433 -- 1440},
  year      = {2000},
  language  = {en}
}
@article{PrumeWaserFrankenetal.2000,
  author    = {Prume, Klaus and Waser, Rainer and Franken, Klaus and Maier, Horst R.},
  title     = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;},
  series = {Journal of the American Ceramic Society. 83 (2000), H. 5},
  journal   = {Journal of the American Ceramic Society. 83 (2000), H. 5},
  isbn      = {0002-7820},
  pages     = {1153 -- 1159},
  year      = {2000},
  language  = {en}
}
@article{PrumeReichenbergRoelofsetal.2004,
  author    = {Prume, Klaus and Reichenberg, B. and Roelofs, A. and Waser, R.},
  title     = {In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.},
  series = {Journal of the European Ceramic Society. 24 (2004), H. 6},
  journal   = {Journal of the European Ceramic Society. 24 (2004), H. 6},
  isbn      = {0955-2219},
  pages     = {1145 -- 1147},
  year      = {2004},
  language  = {en}
}
@article{PrumeWaser2000,
  author    = {Prume, Klaus and Waser, Rainer},
  title     = {Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer},
  series = {Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics. Vol. 2},
  journal   = {Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics. Vol. 2},
  pages     = {675 -- 678},
  year      = {2000},
  language  = {en}
}
@article{Prume2007,
  author    = {Prume, Klaus},
  title     = {Electrical and electromechanical characterization of piezoelectric thin films in view of MEMS application / Tiedke, S. ; Prume, K. ; Schmitz-Kempen, T.;},
  pages     = {702},
  year      = {2007},
  language  = {en}
}