@article{SchmidtTonnesmannFoersteretal.2000, author = {Schmidt, R. and Tonnesmann, A. and F{\"o}rster, Arnold and Grimm, M. and Kordos, P. and L{\"u}th, H.}, title = {Metamorphic InAlAs/InGaAs HEMT's on GaAs substrates using an InP buffer layer}, series = {8th IEEE International Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications : EDMO 2000 ; [13 - 14 November 2000, University of Glasgow] / organised by Department of Electronics and Electrical Engineering, University of Glasgow, Glasgow Scotland. MTT/ED/AP/LEO Societies Joint Chapter, United Kingdom and Republic of Ireland Section. With technical co-sponsorship from IEEE Electron Device Society}, journal = {8th IEEE International Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications : EDMO 2000 ; [13 - 14 November 2000, University of Glasgow] / organised by Department of Electronics and Electrical Engineering, University of Glasgow, Glasgow Scotland. MTT/ED/AP/LEO Societies Joint Chapter, United Kingdom and Republic of Ireland Section. With technical co-sponsorship from IEEE Electron Device Society}, publisher = {IEEE Operations Center}, address = {Piscataway, NJ}, isbn = {0-7803-6550-X}, pages = {95 -- 98}, year = {2000}, language = {en} } @article{VitusevichFoersterReetzetal.2000, author = {Vitusevich, S. A. and F{\"o}rster, Arnold and Reetz, W. and L{\"u}th, H. and Belyaev, A. E. and Danylyuk, S. V.}, title = {Fine structure of photoresponse spectra in a double-barrier resonant tunnelling diode}, series = {Nanotechnology. 11 (2000), H. 4}, journal = {Nanotechnology. 11 (2000), H. 4}, isbn = {1361-6528}, pages = {305 -- 308}, year = {2000}, language = {en} } @article{DarmoSchaefferFoersteretal.2000, author = {Darmo, J. and Sch{\"a}ffer, F. and F{\"o}rster, Arnold and Kordos, P.}, title = {Beryllium doped low-temperature-grown MBE GaAs: material for photomixing in the THz frequency range}, series = {ASDAM 2000 : conference proceedings / edited by Jozef Osvald ... [et al.]}, journal = {ASDAM 2000 : conference proceedings / edited by Jozef Osvald ... [et al.]}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {0780359399}, pages = {147 -- 150}, year = {2000}, language = {en} } @article{RosenauerOberstLitvinovetal.2000, author = {Rosenauer, A. and Oberst, W. and Litvinov, D. and Gerthsen, D. and F{\"o}rster, Arnold and Schmidt, R.}, title = {Structural and Chemical Investigation of In-0.6Ga0.4As Stranski-Krastanow Layers Burried in GaAs by Transmission Electron Microscopy}, series = {Physical Review B. 61 (2000), H. 12}, journal = {Physical Review B. 61 (2000), H. 12}, isbn = {1095-3795}, pages = {8276 -- 8288}, year = {2000}, language = {en} } @article{Thielemann2000, author = {Thielemann, Frank}, title = {Das Management von Innovationen aus betriebswirtschaftlicher Sicht}, series = {Humanit{\"a}t - Wandel - Utopie / Bernd Rebe (Hrsg.). Mit Beitr. von Ute Daniel}, journal = {Humanit{\"a}t - Wandel - Utopie / Bernd Rebe (Hrsg.). Mit Beitr. von Ute Daniel}, publisher = {Olms}, address = {Hildesheim}, pages = {33 -- 64}, year = {2000}, language = {de} } @article{ThielemannLang2000, author = {Thielemann, Frank and Lang, Franz Peter}, title = {Wissensmanagement und neue Informationstechnologie . Lang, Franz Peter; Thielemann, Frank}, series = {Ver{\"a}nderungsmanagement in der Sozialwirtschaft / Bernd Maelicke (Hrsg.)}, journal = {Ver{\"a}nderungsmanagement in der Sozialwirtschaft / Bernd Maelicke (Hrsg.)}, publisher = {Nomos-Verl.-Ges.}, address = {Baden-Baden}, isbn = {3-7890-6738-5}, pages = {132 -- 172}, year = {2000}, language = {de} } @book{Thielemann2000, author = {Thielemann, Frank}, title = {Kompetenzentwicklung im Mittelstand - das Beispiel Kompetenz-Entwicklungs-Center / hrsg. von Frank Thielemann}, publisher = {MA, Akademie-Verl.- und Druck-Ges.}, address = {Essen}, isbn = {3-89275-031-9}, pages = {302 S. : graph. Darst.}, year = {2000}, language = {de} } @book{Thielemann2000, author = {Thielemann, Frank}, title = {Bilanzen - ein komprimierter {\"U}berblick : Intensivkurs zum betrieblichen Rechnungswesen. 2., {\"u}berarb. Aufl.}, publisher = {MA, Akademie-Verl.- und Druck-Ges.}, address = {Essen}, isbn = {3-89275-026-2}, pages = {S. A - E, 173 S. : graph. Darst.}, year = {2000}, language = {de} } @article{ThielemannLuedtke2000, author = {Thielemann, Frank and L{\"u}dtke, C.}, title = {Einfluß des KonTraG im Unternehmensbereich}, series = {Wirtschafts-Nachrichten. 45 (2000), H. 8}, journal = {Wirtschafts-Nachrichten. 45 (2000), H. 8}, isbn = {1436-5588}, pages = {10 -- f.}, year = {2000}, language = {de} } @article{ThielemannLuedtke2000, author = {Thielemann, Frank and L{\"u}dtke, C.}, title = {Risikomanagement - Aufbau eines Fr{\"u}hwarnsystems}, series = {Wirtschafts-Nachrichten. 45 (2000), H. 12}, journal = {Wirtschafts-Nachrichten. 45 (2000), H. 12}, isbn = {1436-5588}, pages = {14 -- ff}, year = {2000}, language = {de} }