@article{PrumeReichenbergRoelofsetal.2004,
  author    = {Prume, Klaus and Reichenberg, B. and Roelofs, A. and Waser, R.},
  title     = {In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.},
  series = {Journal of the European Ceramic Society. 24 (2004), H. 6},
  journal   = {Journal of the European Ceramic Society. 24 (2004), H. 6},
  isbn      = {0955-2219},
  pages     = {1145 -- 1147},
  year      = {2004},
  language  = {en}
}
@article{PrumeTiedkeSchmitzetal.2001,
  author    = {Prume, Klaus and Tiedke, S. and Schmitz, T. and Roelofs, A.},
  title     = {Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs},
  series = {Applied Physics Letters. 79 (2001), H. 22},
  journal   = {Applied Physics Letters. 79 (2001), H. 22},
  isbn      = {0003-6951},
  pages     = {3678 -- 3680},
  year      = {2001},
  language  = {en}
}
@article{PrumeGerberRoelofsetal.2004,
  author    = {Prume, Klaus and Gerber, P. and Roelofs, A. and K{\"u}geler, C.},
  title     = {Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; K{\"u}geler, C.; B{\"o}ttger, U. ; Waser, R. ; Prume, K. ;},
  series = {Journal of Applied Physics . 96 (2004), H. 5},
  journal   = {Journal of Applied Physics . 96 (2004), H. 5},
  isbn      = {0021-8979},
  pages     = {2800 -- 2804},
  year      = {2004},
  language  = {en}
}