@article{HeuermannRumiantsevSchott2004,
  author    = {Heuermann, Holger and Rumiantsev, A. and Schott, S.},
  title     = {Advanced on-wafer multiport calibration methods for mono- and mixed-mode device characterization},
  series = {On wafer characterization : 63rd ARFTG conference digest, spring 2004, 11 June 2004, Fort Worth, TX / Automatic RF Techniques Group. [Conference chair: John Cable. Publication chair: J. G. Burns]},
  journal   = {On wafer characterization : 63rd ARFTG conference digest, spring 2004, 11 June 2004, Fort Worth, TX / Automatic RF Techniques Group. [Conference chair: John Cable. Publication chair: J. G. Burns]},
  publisher = {IEEE Operations Center},
  address   = {Piscataway, NJ},
  isbn      = {0-7803-8371-0},
  pages     = {91 -- 96},
  year      = {2004},
  language  = {en}
}