@article{HeuermannSchiek1993, author = {Heuermann, Holger and Schiek, Burkhard}, title = {LNN( Line-Network-Network): The In-Fixture Calibration Procedure}, pages = {149 -- 149}, year = {1993}, language = {en} } @article{HeuermannSchiek1992, author = {Heuermann, Holger and Schiek, Burkhard}, title = {A Fast and Robust Procedure for the Determination of the Scattering Parameters for Network Analyzer Calibration}, address = {Paris}, pages = {373 -- 374}, year = {1992}, language = {en} } @article{HeuermannSchiek1994, author = {Heuermann, Holger and Schiek, Burkhard}, title = {Error Corrected Impedance Measurements with a Network Analyzer}, pages = {125 -- 126}, year = {1994}, language = {en} } @article{HeuermannSchiek1992, author = {Heuermann, Holger and Schiek, Burkhard}, title = {A Generalization of the Txx Network Analyzer Self-Calibration Procedure}, series = {Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2}, journal = {Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2}, publisher = {Microwave Exhibitions and Publishers}, address = {Tunbridge Wells}, isbn = {0-946821-77-1}, pages = {907 -- 912}, year = {1992}, language = {en} } @article{HeuermannSchiek1992, author = {Heuermann, Holger and Schiek, Burkhard}, title = {The In-Fixture Calibration Procedure Line-Network-Network-LNN}, series = {Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community]}, journal = {Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community]}, publisher = {Reed Exhibition Companies}, address = {Tunbridge Wells}, isbn = {0-946821-23-2}, pages = {500 -- 505}, year = {1992}, language = {en} } @article{HeuermannSchiek1994, author = {Heuermann, Holger and Schiek, Burkhard}, title = {Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique}, series = {Conference proceedings : [Palais des Festivals et des Congr{\`e}s Cannes, France, 5 - 8 September 1994]}, journal = {Conference proceedings : [Palais des Festivals et des Congr{\`e}s Cannes, France, 5 - 8 September 1994]}, publisher = {Nexus Business Communications}, address = {Swanley}, isbn = {0-9518032-5-5}, year = {1994}, language = {en} } @article{HeuermannSchiek1995, author = {Heuermann, Holger and Schiek, Burkhard}, title = {The double-LNN Calibration technique for scattering parameter measurements of microstrip devices}, series = {Conference proceedings}, journal = {Conference proceedings}, publisher = {NEXUS House}, address = {Kent}, pages = {343 -- 347}, year = {1995}, language = {en} } @article{HeuermannSchiek1994, author = {Heuermann, Holger and Schiek, Burkhard}, title = {Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure}, pages = {1361 -- 1364}, year = {1994}, language = {en} } @article{HeuermannSchiek1993, author = {Heuermann, Holger and Schiek, B.}, title = {Procedures for the Determination of the Scattering Parameters for Network Analyzer Calibration}, series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2}, journal = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2}, isbn = {0018-9456}, pages = {528 -- 531}, year = {1993}, language = {en} } @article{HeuermannSchiek1994, author = {Heuermann, Holger and Schiek, B.}, title = {Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures}, series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1}, journal = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1}, isbn = {0018-9456}, pages = {18 -- 23}, year = {1994}, language = {en} } @article{HeuermannSchiek1995, author = {Heuermann, Holger and Schiek, B.}, title = {Error corrected impedance measurements with a network analyzer}, series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2}, journal = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2}, isbn = {0018-9456}, pages = {295 -- 299}, year = {1995}, language = {en} } @article{HeuermannSchiek1997, author = {Heuermann, Holger and Schiek, B.}, title = {Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques}, series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5}, journal = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5}, isbn = {0018-9456}, pages = {1120 -- 1127}, year = {1997}, language = {en} } @article{HeuermannSchiek1997, author = {Heuermann, Holger and Schiek, B.}, title = {15-term self-calibration methods for the error-correction of on-wafer measurements}, series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5}, journal = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5}, isbn = {0018-9456}, pages = {1105 -- 1110}, year = {1997}, language = {en} } @article{HeuermannSadeghfamBoehm2005, author = {Heuermann, Holger and Sadeghfam, Arash and Boehm, H.}, title = {Ultra Compact Multi-Mode Filter with Novel Rat-Race Inductor. Sadeghfam, Arash; Heuermann, Holger; Boehm, H.}, series = {Conference proceedings : 3 - 7 October 2005, CNIT la D{\´e}fense, Paris, France; [comprises the] 35th European Microwave Conference 2005 ; The European Conference on Wireless Technology 2005 ; European Radar Conference 2005 ; GAAS 2005, The European Gallium A. Vol. 2}, journal = {Conference proceedings : 3 - 7 October 2005, CNIT la D{\´e}fense, Paris, France; [comprises the] 35th European Microwave Conference 2005 ; The European Conference on Wireless Technology 2005 ; European Radar Conference 2005 ; GAAS 2005, The European Gallium A. Vol. 2}, publisher = {Horizon House Publ}, address = {London}, isbn = {2-9600551-0-1}, pages = {4 pp.}, year = {2005}, language = {en} } @article{HeuermannSadeghfam2004, author = {Heuermann, Holger and Sadeghfam, Arash}, title = {Novel balanced inductor for compact differential systems / Sadeghfam, Arash; Heuermann, Holger}, series = {Conference proceedings : Tuesday 12th, Wednesday 13th and Thursday 14th October, [RAI International Exhibition and Congress Centre, Amsterdam ; part of European Microwave Week 2004] / EuMA, European Microwave Association}, journal = {Conference proceedings : Tuesday 12th, Wednesday 13th and Thursday 14th October, [RAI International Exhibition and Congress Centre, Amsterdam ; part of European Microwave Week 2004] / EuMA, European Microwave Association}, publisher = {Horizon House Publ.}, address = {London}, isbn = {1-580-53992-0}, pages = {709 -- 712}, year = {2004}, language = {en} } @article{HeuermannSadeghfam2008, author = {Heuermann, Holger and Sadeghfam, Arash}, title = {Electrically tunable bandpass filter with integrated carrier suppression for UHF RFID systems / Sadeghfam, Arash ; Heuermann, Holger}, series = {European Microwave Conference, 2008, EuMC 2008, 38th}, journal = {European Microwave Conference, 2008, EuMC 2008, 38th}, isbn = {978-2-87487-006-4}, pages = {1727 -- 1730}, year = {2008}, language = {en} } @article{HeuermannSadeghfam2007, author = {Heuermann, Holger and Sadeghfam, Arash}, title = {On the design of multimode integrated circuits in multilayered processes / Sadeghfam, A. ; Heuermann, H.}, series = {European Microwave Conference, 2007, 9-12 Oct. 2007}, journal = {European Microwave Conference, 2007, 9-12 Oct. 2007}, isbn = {978-2-87487-001-9}, pages = {516 -- 519}, year = {2007}, language = {en} } @article{HeuermannSadeghfam2008, author = {Heuermann, Holger and Sadeghfam, Arash}, title = {Electrically tunable bandpass filter with integrated carrier suppression for UHF RFID systems / Sadeghfam, Arash ; Heuermann, Holger}, series = {European Conference on Wireless Technology, 2008. EuWiT 2008.}, journal = {European Conference on Wireless Technology, 2008. EuWiT 2008.}, isbn = {978-2-87487-008-8}, pages = {306 -- 309}, year = {2008}, language = {en} } @article{HeuermannSadeghfam2009, author = {Heuermann, Holger and Sadeghfam, A.}, title = {Enhanced system architecture for rugged wide band data transmission / Sadeghfam, A. ; Heuermann, H.}, series = {European Radar Conference, 2009 : EuRAD 2009 ; Sept. 30 - Oct. 2 2009, Rome, Italy ; part of the European Microwave Week (EuMW) / sponsored by EuMA, European Microwave Association}, journal = {European Radar Conference, 2009 : EuRAD 2009 ; Sept. 30 - Oct. 2 2009, Rome, Italy ; part of the European Microwave Week (EuMW) / sponsored by EuMA, European Microwave Association}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {978-2-87487-014-9}, pages = {347 -- 350}, year = {2009}, language = {en} } @article{HeuermannRumiantsevSchott2004, author = {Heuermann, Holger and Rumiantsev, A. and Schott, S.}, title = {Advanced on-wafer multiport calibration methods for mono- and mixed-mode device characterization}, series = {On wafer characterization : 63rd ARFTG conference digest, spring 2004, 11 June 2004, Fort Worth, TX / Automatic RF Techniques Group. [Conference chair: John Cable. Publication chair: J. G. Burns]}, journal = {On wafer characterization : 63rd ARFTG conference digest, spring 2004, 11 June 2004, Fort Worth, TX / Automatic RF Techniques Group. [Conference chair: John Cable. Publication chair: J. G. Burns]}, publisher = {IEEE Operations Center}, address = {Piscataway, NJ}, isbn = {0-7803-8371-0}, pages = {91 -- 96}, year = {2004}, language = {en} }