@article{Schoening2005,
  author    = {Sch{\"o}ning, Michael Josef},
  title     = {"Playing around" with field-effect sensors on the basis of EIS structures, LAPS and ISFETs},
  series = {Sensors. 5 (2005), H. 3},
  journal   = {Sensors. 5 (2005), H. 3},
  isbn      = {1424-8220},
  pages     = {126 -- 138},
  year      = {2005},
  language  = {en}
}
@article{SchoeningNaetherAugeretal.2005,
  author    = {Sch{\"o}ning, Michael Josef and N{\"a}ther, Niko and Auger, V. and Poghossian, Arshak and Koudelka-Hep, M.},
  title     = {Miniaturised flow-through cell with integrated capacitive EIS sensor fabricated at wafer level using Si and SU-8 technologies},
  series = {Sensors and Actuators B. 108 (2005), H. 1-2},
  journal   = {Sensors and Actuators B. 108 (2005), H. 1-2},
  isbn      = {0925-4005},
  pages     = {986 -- 992},
  year      = {2005},
  language  = {en}
}
@article{PoghossianCherstvyIngebrandtetal.2005,
  author    = {Poghossian, Arshak and Cherstvy, A. and Ingebrandt, S. and Offenh{\"a}usser, A. and Sch{\"o}ning, Michael Josef},
  title     = {Possibilities and limitations of label-free detection of DNA hybridization with field-effect-based devices},
  series = {Sensors and Actuators B. 111-112 (2005)},
  journal   = {Sensors and Actuators B. 111-112 (2005)},
  isbn      = {0925-4005},
  pages     = {470 -- 480},
  year      = {2005},
  language  = {en}
}
@article{NaetherRolkaPoghossianetal.2005,
  author    = {N{\"a}ther, Niko and Rolka, David and Poghossian, Arshak and Koudelka-Hep, M. and Sch{\"o}ning, Michael Josef},
  title     = {Two microcell flow-injection analysis (FIA) platforms for capacitive silicon-based field-effect sensors},
  series = {Electrochimica Acta. 51 (2005), H. 5},
  journal   = {Electrochimica Acta. 51 (2005), H. 5},
  isbn      = {0013-4686},
  doi       = {10.1016/j.electacta.2005.04.066},
  pages     = {924 -- 929},
  year      = {2005},
  language  = {en}
}
@article{SimonisDawgulLuethetal.2005,
  author    = {Simonis, A. and Dawgul, M. and L{\"u}th, H. and Sch{\"o}ning, Michael Josef},
  title     = {Miniaturised reference electrodes for field-effect sensors compatible to silicon chip technology},
  series = {Electrochimica Acta. 51 (2005), H. 5},
  journal   = {Electrochimica Acta. 51 (2005), H. 5},
  isbn      = {0013-4686},
  doi       = {10.1016/j.electacta.2005.04.063},
  pages     = {930 -- 937},
  year      = {2005},
  language  = {en}
}
@article{PoghossianPlatenSchoening2005,
  author    = {Poghossian, Arshak and Platen, J. and Sch{\"o}ning, Michael Josef},
  title     = {Towards self-aligned nanostructures by means of layerexpansion technique},
  series = {Electrochimica Acta. 51 (2005), H. 5},
  journal   = {Electrochimica Acta. 51 (2005), H. 5},
  isbn      = {0013-4686},
  pages     = {838 -- 843},
  year      = {2005},
  language  = {en}
}
@article{Staat2005,
  author    = {Staat, Manfred},
  title     = {Local and global collapse pressure of longitudinally flawed pipes and cylindrical vessels},
  series = {International Journal of Pressure Vessels and Piping. 82 (2005), H. 3},
  journal   = {International Journal of Pressure Vessels and Piping. 82 (2005), H. 3},
  isbn      = {0308-0161},
  pages     = {217 -- 225},
  year      = {2005},
  language  = {en}
}
@article{StaatHeitzerLangetal.2005,
  author    = {Staat, Manfred and Heitzer, M. and Lang, H. and Wirtz, K.},
  title     = {Direct Finite Element Route for Design-by-Analysis of Pressure Components},
  series = {International Journal of Pressure Vessels and Piping. 82 (2005), H. 1},
  journal   = {International Journal of Pressure Vessels and Piping. 82 (2005), H. 1},
  isbn      = {0308-0161},
  pages     = {61 -- 67},
  year      = {2005},
  language  = {en}
}
@article{Staat2005,
  author    = {Staat, Manfred},
  title     = {Direct finite element route for design-by-analysis of pressure components},
  year      = {2005},
  abstract  = {In the new European standard for unfired pressure vessels, EN 13445-3, there are two approaches for carrying out a Design-by-Analysis that cover both the stress categorization method (Annex C) and the direct route method (Annex B) for a check against global plastic deformation and against progressive plastic deformation. This paper presents the direct route in the language of limit and shakedown analysis. This approach leads to an optimization problem. Its solution with Finite Element Analysis is demonstrated for mechanical and thermal actions. One observation from the examples is that the so-called 3f (3Sm) criterion fails to be a reliable check against progressive plastic deformation. Precise conditions are given, which greatly restrict the applicability of the 3f criterion.},
  subject      = {Einspielen <Werkstoff>},
  language  = {en}
}
@article{Staat2005,
  author    = {Staat, Manfred},
  title     = {Local and global collapse pressure of longitudinally flawed pipes and cylindrical vessels},
  year      = {2005},
  abstract  = {Limit loads can be calculated with the finite element method (FEM) for any component, defect geometry, and loading. FEM suggests that published long crack limit formulae for axial defects under-estimate the burst pressure for internal surface defects in thick pipes while limit loads are not conservative for deep cracks and for pressure loaded crack-faces. Very deep cracks have a residual strength, which is modelled by a global collapse load. These observations are combined to derive new analytical local and global collapse loads. The global collapse loads are close to FEM limit analyses for all crack dimensions.},
  subject      = {Finite-Elemente-Methode},
  language  = {en}
}