@article{PrumeReichenbergRoelofsetal.2004, author = {Prume, Klaus and Reichenberg, B. and Roelofs, A. and Waser, R.}, title = {In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.}, series = {Journal of the European Ceramic Society. 24 (2004), H. 6}, journal = {Journal of the European Ceramic Society. 24 (2004), H. 6}, isbn = {0955-2219}, pages = {1145 -- 1147}, year = {2004}, language = {en} } @article{PrumeWaser2000, author = {Prume, Klaus and Waser, Rainer}, title = {Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer}, series = {Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics. Vol. 2}, journal = {Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics. Vol. 2}, pages = {675 -- 678}, year = {2000}, language = {en} } @article{Prume2007, author = {Prume, Klaus}, title = {Electrical and electromechanical characterization of piezoelectric thin films in view of MEMS application / Tiedke, S. ; Prume, K. ; Schmitz-Kempen, T.;}, pages = {702}, year = {2007}, language = {en} } @article{PrumeMuraltCalameetal.2007, author = {Prume, Klaus and Muralt, P. and Calame, F. and Schmitz-Kempen, T.}, title = {Piezoelectric thin films: evaluation of electrical and electromechanical characteristics for MEMS devices / Prume, K. ; Muralt, P. ; Calame, F. ; Schmitz-Kempen, T. ; Tiedke, S. ;}, series = {IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control. 54 (2007), H. 1}, journal = {IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control. 54 (2007), H. 1}, isbn = {0885-3010}, pages = {81 -- 14}, year = {2007}, language = {en} } @article{PrumeTiedkeSchmitzetal.2001, author = {Prume, Klaus and Tiedke, S. and Schmitz, T. and Roelofs, A.}, title = {Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs}, series = {Applied Physics Letters. 79 (2001), H. 22}, journal = {Applied Physics Letters. 79 (2001), H. 22}, isbn = {0003-6951}, pages = {3678 -- 3680}, year = {2001}, language = {en} } @article{PrumeGerberRoelofsetal.2004, author = {Prume, Klaus and Gerber, P. and Roelofs, A. and K{\"u}geler, C.}, title = {Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; K{\"u}geler, C.; B{\"o}ttger, U. ; Waser, R. ; Prume, K. ;}, series = {Journal of Applied Physics . 96 (2004), H. 5}, journal = {Journal of Applied Physics . 96 (2004), H. 5}, isbn = {0021-8979}, pages = {2800 -- 2804}, year = {2004}, language = {en} } @article{PrumePeterRuedigeretal.2005, author = {Prume, Klaus and Peter, F. and R{\"u}diger, A. and Dittmann, R.}, title = {Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates / Peter, F. ; R{\"u}diger, A. ; Dittmann, R. ; Waser, R. ; Szot, K. ; Reichenberg, B. ; Prume, K. ;}, series = {Applied Physics Letters . 87 (2005), H. 8}, journal = {Applied Physics Letters . 87 (2005), H. 8}, isbn = {0003-6951}, pages = {082901 -- 082901-3}, year = {2005}, language = {en} } @article{PrumeGerberKuegeleretal.2004, author = {Prume, Klaus and Gerber, Peter and K{\"u}geler, Carsten and Roelofs, Andreas}, title = {Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size / Prume, K. ; Gerber, P. ; K{\"u}geler, C. ; Roelofs, A. ; B{\"o}ttger, U. ; Waser, R. ; Schmitz-Kempen,}, isbn = {0-7803-8410-5}, pages = {7 -- 10}, year = {2004}, language = {en} }