@article{FoersterRosenauerOberstetal.1999, author = {F{\"o}rster, Arnold and Rosenauer, A. and Oberst, W. and Gerthsen, D.}, title = {Atomic scale analysis of the indium distribution in InGaAs/GaAs (001) heterostructures: segregation, lateral indium redistribution and the effect of growth interruptions. Rosenauer, A. ; Oberst, W. ; Gerthsen, D. ; F{\"o}rster, A.}, series = {Thin Solid Films. 357 (1999)}, journal = {Thin Solid Films. 357 (1999)}, isbn = {0040-6090}, pages = {18 -- 21}, year = {1999}, language = {en} } @article{FoersterRosenauerFischeretal.1998, author = {F{\"o}rster, Arnold and Rosenauer, A. and Fischer, U. and Gerthsen, D.}, title = {Composition evaluation by lattice fringe analysis. Rosenauer, A.; Fischer U.; Gerthsen D.; F{\"o}rster A.}, series = {Ultramicroscopy. 72 (1998), H. 3-4}, journal = {Ultramicroscopy. 72 (1998), H. 3-4}, isbn = {0304-3991}, pages = {121 -- 133}, year = {1998}, language = {en} } @article{RosenauerOberstLitvinovetal.2000, author = {Rosenauer, A. and Oberst, W. and Litvinov, D. and Gerthsen, D. and F{\"o}rster, Arnold and Schmidt, R.}, title = {Structural and Chemical Investigation of In-0.6Ga0.4As Stranski-Krastanow Layers Burried in GaAs by Transmission Electron Microscopy}, series = {Physical Review B. 61 (2000), H. 12}, journal = {Physical Review B. 61 (2000), H. 12}, isbn = {1095-3795}, pages = {8276 -- 8288}, year = {2000}, language = {en} } @article{FoersterRosenauerFischeretal.1997, author = {F{\"o}rster, Arnold and Rosenauer, A. and Fischer, U. and Gerthsen, D.}, title = {Composition evaluation of InxGa1 - xAs Stranski-Krastanow-island structures by strain state analysis / A. Rosenauer ; U. Fischer ; D. Gerthsen ; A. F{\"o}rster}, series = {Applied physics letters. 71 (1997), H. 26}, journal = {Applied physics letters. 71 (1997), H. 26}, isbn = {0003-6951}, pages = {3868 -- 3870}, year = {1997}, language = {en} } @article{FoersterRosenauerRemmele1997, author = {F{\"o}rster, Arnold and Rosenauer, A. and Remmele, T.}, title = {Strain determination in mismatched semiconductor heterostructures by the digital analysis of lattice images / A. Rosenauer ; T. Remmele ; U. Fischer ; A. F{\"o}rster ...}, series = {Microscopy of semiconducting materials 1997 : proceedings of the Royal Microscopical Society Conference held at Oxford University, 7 - 10 April 1997 / ed. by A. G. Cullis ... - (Conference series / Institute of Physics ; 157)}, journal = {Microscopy of semiconducting materials 1997 : proceedings of the Royal Microscopical Society Conference held at Oxford University, 7 - 10 April 1997 / ed. by A. G. Cullis ... - (Conference series / Institute of Physics ; 157)}, publisher = {Institute of Physics}, address = {Bristol [u.a.]}, isbn = {0-7503-0464-2}, pages = {39 -- ff.}, year = {1997}, language = {en} } @article{FoersterRosenauerRemmele1997, author = {F{\"o}rster, Arnold and Rosenauer, A. and Remmele, T.}, title = {Atomic scale strain measurements by the digital analysis of transmission electron microscopic lattice images / A. Rosenauer ; T. Remmele ; D. Gerthsen ... A. F{\"o}rster}, series = {Optik : international journal for light and electron optics. 105 (1997), H. 3}, journal = {Optik : international journal for light and electron optics. 105 (1997), H. 3}, isbn = {0030-4026}, pages = {99 -- 107}, year = {1997}, language = {en} }