@article{HeuermannSchiek1992,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {A Fast and Robust Procedure for the Determination of the Scattering Parameters for Network Analyzer Calibration},
  address   = {Paris},
  pages     = {373 -- 374},
  year      = {1992},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Error Corrected Impedance Measurements with a Network Analyzer},
  pages     = {125 -- 126},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1992,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {A Generalization of the Txx Network Analyzer Self-Calibration Procedure},
  series = {Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2},
  journal   = {Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2},
  publisher = {Microwave Exhibitions and Publishers},
  address   = {Tunbridge Wells},
  isbn      = {0-946821-77-1},
  pages     = {907 -- 912},
  year      = {1992},
  language  = {en}
}
@article{HeuermannSchiek1992,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {The In-Fixture Calibration Procedure Line-Network-Network-LNN},
  series = {Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community]},
  journal   = {Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community]},
  publisher = {Reed Exhibition Companies},
  address   = {Tunbridge Wells},
  isbn      = {0-946821-23-2},
  pages     = {500 -- 505},
  year      = {1992},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique},
  series = {Conference proceedings : [Palais des Festivals et des Congr{\`e}s Cannes, France, 5 - 8 September 1994]},
  journal   = {Conference proceedings : [Palais des Festivals et des Congr{\`e}s Cannes, France, 5 - 8 September 1994]},
  publisher = {Nexus Business Communications},
  address   = {Swanley},
  isbn      = {0-9518032-5-5},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1995,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {The double-LNN Calibration technique for scattering parameter measurements of microstrip devices},
  series = {Conference proceedings},
  journal   = {Conference proceedings},
  publisher = {NEXUS House},
  address   = {Kent},
  pages     = {343 -- 347},
  year      = {1995},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure},
  pages     = {1361 -- 1364},
  year      = {1994},
  language  = {en}
}