@article{Heuermann2003, author = {Heuermann, Holger}, title = {GSOLT: the calibration procedure for all multi-port vector network analyzers}, series = {IEEE MTT-S International Microwave Symposium digest : Philadelphia, Pennsylvania, 8 - 13 June 2003 ; [including: 2003 International Microwave Symposium digest, vol. 1-3, RF Integrated Circuit Symposium digest, Automatic RF Techniques Group Symposium digest . Vol. 3}, journal = {IEEE MTT-S International Microwave Symposium digest : Philadelphia, Pennsylvania, 8 - 13 June 2003 ; [including: 2003 International Microwave Symposium digest, vol. 1-3, RF Integrated Circuit Symposium digest, Automatic RF Techniques Group Symposium digest . Vol. 3}, publisher = {IEEE}, address = {Piscataway, NJ}, isbn = {0-780-37696-X}, pages = {1815 -- 1818}, year = {2003}, language = {en} } @article{Heuermann1999, author = {Heuermann, Holger}, title = {Calibration procedures with series impedances and unknown lines simplify on-wafer measurements}, series = {IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 47 (1999), H. 1}, journal = {IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 47 (1999), H. 1}, isbn = {0018-9480}, pages = {1 -- 5}, year = {1999}, language = {en} } @article{HeuermannSchiek1997, author = {Heuermann, Holger and Schiek, B.}, title = {Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques}, series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5}, journal = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5}, isbn = {0018-9456}, pages = {1120 -- 1127}, year = {1997}, language = {en} } @article{HeuermannSchiek1997, author = {Heuermann, Holger and Schiek, B.}, title = {15-term self-calibration methods for the error-correction of on-wafer measurements}, series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5}, journal = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5}, isbn = {0018-9456}, pages = {1105 -- 1110}, year = {1997}, language = {en} } @article{HeuermannSchiek1997, author = {Heuermann, Holger and Schiek, Burkhard}, title = {Line Network Network (LNN): an alternative in-fixture calibration procedure}, series = {IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3}, journal = {IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3}, isbn = {0018-9480}, pages = {408 -- 413}, year = {1997}, language = {en} } @article{Heuermann1997, author = {Heuermann, Holger}, title = {Microwave On-Wafer Measurements with Activ Needle Probe Tips}, pages = {208 -- 214}, year = {1997}, language = {en} } @article{Heuermann1996, author = {Heuermann, Holger}, title = {Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures}, pages = {136 -- 145}, year = {1996}, language = {en} } @article{HeuermannStolleSchiek1995, author = {Heuermann, Holger and Stolle, Reinhard and Schiek, Burkhard}, title = {Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B.}, pages = {129 -- 132}, year = {1995}, language = {en} } @article{HeuermannSchiek1995, author = {Heuermann, Holger and Schiek, B.}, title = {Error corrected impedance measurements with a network analyzer}, series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2}, journal = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2}, isbn = {0018-9456}, pages = {295 -- 299}, year = {1995}, language = {en} } @article{HeuermannSchiek1995, author = {Heuermann, Holger and Schiek, Burkhard}, title = {The double-LNN Calibration technique for scattering parameter measurements of microstrip devices}, series = {Conference proceedings}, journal = {Conference proceedings}, publisher = {NEXUS House}, address = {Kent}, pages = {343 -- 347}, year = {1995}, language = {en} }