@article{HeuermannSchiek1993,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {Procedures for the Determination of the Scattering Parameters for Network Analyzer Calibration},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2},
  isbn      = {0018-9456},
  pages     = {528 -- 531},
  year      = {1993},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1},
  isbn      = {0018-9456},
  pages     = {18 -- 23},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1995,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {Error corrected impedance measurements with a network analyzer},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2},
  isbn      = {0018-9456},
  pages     = {295 -- 299},
  year      = {1995},
  language  = {en}
}
@article{HeuermannSchiek1997,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5},
  isbn      = {0018-9456},
  pages     = {1120 -- 1127},
  year      = {1997},
  language  = {en}
}
@article{HeuermannSchiek1997,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {15-term self-calibration methods for the error-correction of on-wafer measurements},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5},
  isbn      = {0018-9456},
  pages     = {1105 -- 1110},
  year      = {1997},
  language  = {en}
}