@article{HeuermannSchiek1993,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {Procedures for the Determination of the Scattering Parameters for Network Analyzer Calibration},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2},
  isbn      = {0018-9456},
  pages     = {528 -- 531},
  year      = {1993},
  language  = {en}
}
@article{HeuermannStolleSchiek1995,
  author    = {Heuermann, Holger and Stolle, Reinhard and Schiek, Burkhard},
  title     = {Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B.},
  pages     = {129 -- 132},
  year      = {1995},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1},
  isbn      = {0018-9456},
  pages     = {18 -- 23},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1995,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {Error corrected impedance measurements with a network analyzer},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2},
  isbn      = {0018-9456},
  pages     = {295 -- 299},
  year      = {1995},
  language  = {en}
}
@article{HeuermannSchiek1997,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5},
  isbn      = {0018-9456},
  pages     = {1120 -- 1127},
  year      = {1997},
  language  = {en}
}
@article{HeuermannSchiek1997,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {15-term self-calibration methods for the error-correction of on-wafer measurements},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5},
  isbn      = {0018-9456},
  pages     = {1105 -- 1110},
  year      = {1997},
  language  = {en}
}
@article{HeuermannSchiek1997,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Line Network Network (LNN): an alternative in-fixture calibration procedure},
  series = {IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3},
  journal   = {IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3},
  isbn      = {0018-9480},
  pages     = {408 -- 413},
  year      = {1997},
  language  = {en}
}
@article{Heuermann1999,
  author    = {Heuermann, Holger},
  title     = {Calibration procedures with series impedances and unknown lines simplify on-wafer measurements},
  series = {IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 47 (1999), H. 1},
  journal   = {IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 47 (1999), H. 1},
  isbn      = {0018-9480},
  pages     = {1 -- 5},
  year      = {1999},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Calibration of network analyser measurements with leakage errors},
  series = {Electronics letters. 30 (1994), H. 1},
  journal   = {Electronics letters. 30 (1994), H. 1},
  isbn      = {0013-5194},
  pages     = {52 -- 53},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1992,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {LNN (Line-Network-Network): Verfahren zur Kalibrierung von Netzwerkanalysatoren},
  series = {Kleinheubacher Berichte : Vortr{\"a}ge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 36. 1992 (1992)},
  journal   = {Kleinheubacher Berichte : Vortr{\"a}ge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 36. 1992 (1992)},
  pages     = {327 -- 335},
  year      = {1992},
  language  = {en}
}
@article{HeuermannSchiek1993,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {LNN( Line-Network-Network): The In-Fixture Calibration Procedure},
  pages     = {149 -- 149},
  year      = {1993},
  language  = {en}
}
@article{HeuermannSchiek1992,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {A Fast and Robust Procedure for the Determination of the Scattering Parameters for Network Analyzer Calibration},
  address   = {Paris},
  pages     = {373 -- 374},
  year      = {1992},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Error Corrected Impedance Measurements with a Network Analyzer},
  pages     = {125 -- 126},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1992,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {A Generalization of the Txx Network Analyzer Self-Calibration Procedure},
  series = {Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2},
  journal   = {Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2},
  publisher = {Microwave Exhibitions and Publishers},
  address   = {Tunbridge Wells},
  isbn      = {0-946821-77-1},
  pages     = {907 -- 912},
  year      = {1992},
  language  = {en}
}
@article{HeuermannSchiek1992,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {The In-Fixture Calibration Procedure Line-Network-Network-LNN},
  series = {Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community]},
  journal   = {Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community]},
  publisher = {Reed Exhibition Companies},
  address   = {Tunbridge Wells},
  isbn      = {0-946821-23-2},
  pages     = {500 -- 505},
  year      = {1992},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique},
  series = {Conference proceedings : [Palais des Festivals et des Congr{\`e}s Cannes, France, 5 - 8 September 1994]},
  journal   = {Conference proceedings : [Palais des Festivals et des Congr{\`e}s Cannes, France, 5 - 8 September 1994]},
  publisher = {Nexus Business Communications},
  address   = {Swanley},
  isbn      = {0-9518032-5-5},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1995,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {The double-LNN Calibration technique for scattering parameter measurements of microstrip devices},
  series = {Conference proceedings},
  journal   = {Conference proceedings},
  publisher = {NEXUS House},
  address   = {Kent},
  pages     = {343 -- 347},
  year      = {1995},
  language  = {en}
}
@article{Heuermann1995,
  author    = {Heuermann, Holger},
  title     = {LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements},
  pages     = {129 -- 136},
  year      = {1995},
  language  = {en}
}
@article{Heuermann1996,
  author    = {Heuermann, Holger},
  title     = {Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures},
  pages     = {136 -- 145},
  year      = {1996},
  language  = {en}
}
@article{Heuermann1997,
  author    = {Heuermann, Holger},
  title     = {Microwave On-Wafer Measurements with Activ Needle Probe Tips},
  pages     = {208 -- 214},
  year      = {1997},
  language  = {en}
}