@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1},
  isbn      = {0018-9456},
  pages     = {18 -- 23},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1997,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5},
  isbn      = {0018-9456},
  pages     = {1120 -- 1127},
  year      = {1997},
  language  = {en}
}
@article{HeuermannSchiek1995,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {Error corrected impedance measurements with a network analyzer},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2},
  isbn      = {0018-9456},
  pages     = {295 -- 299},
  year      = {1995},
  language  = {en}
}
@article{HeuermannSchiek1997,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {15-term self-calibration methods for the error-correction of on-wafer measurements},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5},
  isbn      = {0018-9456},
  pages     = {1105 -- 1110},
  year      = {1997},
  language  = {en}
}
@article{HeuermannSchiek1995,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {The double-LNN Calibration technique for scattering parameter measurements of microstrip devices},
  series = {Conference proceedings},
  journal   = {Conference proceedings},
  publisher = {NEXUS House},
  address   = {Kent},
  pages     = {343 -- 347},
  year      = {1995},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Calibration of network analyser measurements with leakage errors},
  series = {Electronics letters. 30 (1994), H. 1},
  journal   = {Electronics letters. 30 (1994), H. 1},
  isbn      = {0013-5194},
  pages     = {52 -- 53},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure},
  pages     = {1361 -- 1364},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique},
  series = {Conference proceedings : [Palais des Festivals et des Congr{\`e}s Cannes, France, 5 - 8 September 1994]},
  journal   = {Conference proceedings : [Palais des Festivals et des Congr{\`e}s Cannes, France, 5 - 8 September 1994]},
  publisher = {Nexus Business Communications},
  address   = {Swanley},
  isbn      = {0-9518032-5-5},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1993,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Neue Kalibrierverfahren fuer on-wafer-Messungen},
  series = {Kleinheubacher Berichte : Vortr{\"a}ge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 37. 1993 (1993)},
  journal   = {Kleinheubacher Berichte : Vortr{\"a}ge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 37. 1993 (1993)},
  pages     = {195 -- 204},
  year      = {1993},
  language  = {de}
}
@article{HeuermannSchiek1992,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {LNN (Line-Network-Network): Verfahren zur Kalibrierung von Netzwerkanalysatoren},
  series = {Kleinheubacher Berichte : Vortr{\"a}ge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 36. 1992 (1992)},
  journal   = {Kleinheubacher Berichte : Vortr{\"a}ge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 36. 1992 (1992)},
  pages     = {327 -- 335},
  year      = {1992},
  language  = {en}
}