@article{ProchnowGebingLadageetal.2011,
  author    = {Prochnow, Nora and Gebing, Tina and Ladage, Kerstin and Krause-Finkeldey, Dorothee and Ourdi, Abessamad El and Bitz, Andreas and Streckert, Joachim and Hansen, Volkert and Dermietzel, Rolf},
  title     = {Electromagnetic field effect or simply stress? Effects of UMTS exposure on hippocampal longterm plasticity in the context of procedure related hormone release},
  series = {PLoS one},
  volume    = {6},
  journal   = {PLoS one},
  number    = {5},
  publisher = {PLOS},
  address   = {San Francisco},
  doi       = {10.1371/journal.pone.0019437},
  pages     = {e19437},
  year      = {2011},
  abstract  = {Harmful effects of electromagnetic fields (EMF) on cognitive and behavioural features of humans and rodents have been controversially discussed and raised persistent concern about adverse effects of EMF on general brain functions. In the present study we applied radio-frequency (RF) signals of the Universal Mobile Telecommunications System (UMTS) to full brain exposed male Wistar rats in order to elaborate putative influences on stress hormone release (corticosteron; CORT and adrenocorticotropic hormone; ACTH) and on hippocampal derived synaptic long-term plasticity (LTP) and depression (LTD) as electrophysiological hallmarks for memory storage and memory consolidation. Exposure was computer controlled providing blind conditions. Nominal brain-averaged specific absorption rates (SAR) as a measure of applied mass-related dissipated RF power were 0, 2, and 10 W/kg over a period of 120 min. Comparison of cage exposed animals revealed, regardless of EMF exposure, significantly increased CORT and ACTH levels which corresponded with generally decreased field potential slopes and amplitudes in hippocampal LTP and LTD. Animals following SAR exposure of 2 W/kg (averaged over the whole brain of 2.3 g tissue mass) did not differ from the sham-exposed group in LTP and LTD experiments. In contrast, a significant reduction in LTP and LTD was observed at the high power rate of SAR (10 W/kg). The results demonstrate that a rate of 2 W/kg displays no adverse impact on LTP and LTD, while 10 W/kg leads to significant effects on the electrophysiological parameters, which can be clearly distinguished from the stress derived background. Our findings suggest that UMTS exposure with SAR in the range of 2 W/kg is not harmful to critical markers for memory storage and memory consolidation, however, an influence of UMTS at high energy absorption rates (10 W/kg) cannot be excluded.},
  language  = {en}
}
@book{Prume2001,
  author    = {Prume, Klaus},
  title     = {Modellierung und Simulation der elektrisch-thermisch-mechanisch gekoppelten Eigenschaften keramischer Vielschichtstrukturen},
  publisher = {Shaker},
  address   = {Aachen},
  isbn      = {3-8265-8309-4},
  pages     = {XII, 122 S. : Ill., graph. Darst.},
  year      = {2001},
  language  = {de}
}
@article{Prume2007,
  author    = {Prume, Klaus},
  title     = {Electrical and electromechanical characterization of piezoelectric thin films in view of MEMS application / Tiedke, S. ; Prume, K. ; Schmitz-Kempen, T.;},
  pages     = {702},
  year      = {2007},
  language  = {en}
}
@article{PrumeBooijVogletal.2007,
  author    = {Prume, Klaus and Booij, W. E. and Vogl, A. H. and Wang, D. T.},
  title     = {A simple and powerful analytical model for MEMS piezoelectric multimorphs / Booij, W. E. ; Vogl, A. H. ; Wang, D. T. ; Tyholdt, F. ; Ostbo, N. P. ; Raeder, H. ; Prume, K.},
  series = {Journal of Electroceramics. 19 (2007), H. 4},
  journal   = {Journal of Electroceramics. 19 (2007), H. 4},
  isbn      = {1385-3449},
  pages     = {387 -- 393},
  year      = {2007},
  language  = {en}
}
@article{PrumeFrankenBoettgeretal.2002,
  author    = {Prume, Klaus and Franken, Klaus and B{\"o}ttger, Ulrich and Waser, Rainer},
  title     = {Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; B{\"o}ttger, Ulrich ; Waser, Rainer ; Maier, Horst R.},
  series = {Journal of the European Ceramic Society. 22 (2002), H. 8},
  journal   = {Journal of the European Ceramic Society. 22 (2002), H. 8},
  isbn      = {0955-2219},
  pages     = {1285 -- 1296},
  year      = {2002},
  language  = {en}
}
@article{PrumeFrankenMaieretal.2000,
  author    = {Prume, Klaus and Franken, Klaus and Maier, Horst R. and Waser, Rainer},
  title     = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer},
  series = {Journal of the American Ceramic Society. 83 (2000), H. 6},
  journal   = {Journal of the American Ceramic Society. 83 (2000), H. 6},
  isbn      = {0002-7820},
  pages     = {1433 -- 1440},
  year      = {2000},
  language  = {en}
}
@article{PrumeGerberRoelofsetal.2004,
  author    = {Prume, Klaus and Gerber, P. and Roelofs, A. and K{\"u}geler, C.},
  title     = {Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; K{\"u}geler, C.; B{\"o}ttger, U. ; Waser, R. ; Prume, K. ;},
  series = {Journal of Applied Physics . 96 (2004), H. 5},
  journal   = {Journal of Applied Physics . 96 (2004), H. 5},
  isbn      = {0021-8979},
  pages     = {2800 -- 2804},
  year      = {2004},
  language  = {en}
}
@article{PrumeGerberKuegeleretal.2004,
  author    = {Prume, Klaus and Gerber, Peter and K{\"u}geler, Carsten and Roelofs, Andreas},
  title     = {Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size / Prume, K. ; Gerber, P. ; K{\"u}geler, C. ; Roelofs, A. ; B{\"o}ttger, U. ; Waser, R. ; Schmitz-Kempen,},
  isbn      = {0-7803-8410-5},
  pages     = {7 -- 10},
  year      = {2004},
  language  = {en}
}
@article{PrumeMeyerWaseretal.2005,
  author    = {Prume, Klaus and Meyer, Ren{\´e} and Waser, Rainer and Schmitz, Torsten},
  title     = {Dynamic leakage current compensation in ferroelectric thin-film capacitor structures / Meyer, Ren{\´e} ; Waser, Rainer ; Prume, Klaus ; Schmitz, Torsten ; Tiedke, Stephan},
  series = {Applied Physics Letters . 86 (2005), H. 14},
  journal   = {Applied Physics Letters . 86 (2005), H. 14},
  isbn      = {0003-6951},
  pages     = {142907-1 -- 142907-3},
  year      = {2005},
  language  = {en}
}
@article{PrumeMuraltCalameetal.2007,
  author    = {Prume, Klaus and Muralt, P. and Calame, F. and Schmitz-Kempen, T.},
  title     = {Piezoelectric thin films: evaluation of electrical and electromechanical characteristics for MEMS devices / Prume, K. ; Muralt, P. ; Calame, F. ; Schmitz-Kempen, T. ; Tiedke, S. ;},
  series = {IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control. 54 (2007), H. 1},
  journal   = {IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control. 54 (2007), H. 1},
  isbn      = {0885-3010},
  pages     = {81 -- 14},
  year      = {2007},
  language  = {en}
}