@article{SchwarzerSilva2003,
  author    = {Schwarzer, Klemens and Silva, Maria Eug{\^e}nia Vieira da},
  title     = {Solar cooking system with or without heat storage for families and institutions},
  series = {Solar energy. 75 (2003), H. 1},
  journal   = {Solar energy. 75 (2003), H. 1},
  isbn      = {0038-092x},
  pages     = {34 -- 41},
  year      = {2003},
  language  = {en}
}
@article{StarkeZackFriedrichetal.2003,
  author    = {Starke, G{\"u}nther and Zack, Y. and Friedrich, A.-P. and Drichel, E.},
  title     = {Simulationswerkzeug bei der Herstellung von mikroelektronischen Komponenten. Schnelles Beurteilen von Alternativen in der Produktionsplanung und im Fertigungsdesign},
  series = {FB/IE - Zeitschrift f{\"u}r Unternehmensentwicklung und Industrial Engineering. 52 (2003), H. 5},
  journal   = {FB/IE - Zeitschrift f{\"u}r Unternehmensentwicklung und Industrial Engineering. 52 (2003), H. 5},
  isbn      = {1431-2271},
  pages     = {204 -- 212},
  year      = {2003},
  language  = {de}
}
@article{Schoening2003,
  author    = {Sch{\"o}ning, Michael Josef},
  title     = {Silicon-based field-effect structures - From dielectrics to bioelectronics},
  series = {Dielectrics in emerging technologies : proceedings of the international symposium ; [papers presented at the First International Symposium on Science and Technology of Dielectrics in Emerging Fields held from 27th April to 2nd May 2003 in Paris, France] / sponsoring divisions: Dielectric Science and Technology, Electronics. Ed.: D. Misra.},
  journal   = {Dielectrics in emerging technologies : proceedings of the international symposium ; [papers presented at the First International Symposium on Science and Technology of Dielectrics in Emerging Fields held from 27th April to 2nd May 2003 in Paris, France] / sponsoring divisions: Dielectric Science and Technology, Electronics. Ed.: D. Misra.},
  publisher = {Electrochemical Society},
  address   = {Pennington, NJ},
  isbn      = {1-56677-346-6},
  pages     = {31 -- 37},
  year      = {2003},
  language  = {en}
}
@article{Schoening2003,
  author    = {Sch{\"o}ning, Michael Josef},
  title     = {Silicon-based biochemical sensors},
  series = {CNI - The Center of Nanoelectronic Systems for Information Technology},
  journal   = {CNI - The Center of Nanoelectronic Systems for Information Technology},
  publisher = {Foschungszentrum J{\"u}lich},
  pages     = {165 -- 170},
  year      = {2003},
  language  = {en}
}
@article{StaatHeitzerReinersetal.2003,
  author    = {Staat, Manfred and Heitzer, M. and Reiners, H. and Schubert, F.},
  title     = {Shakedown and ratchetting under tension-torsion loadings: analysis and experiments},
  series = {Nuclear Engineering and Design. 225 (2003), H. 1},
  journal   = {Nuclear Engineering and Design. 225 (2003), H. 1},
  isbn      = {0029-5493},
  pages     = {11 -- 26},
  year      = {2003},
  language  = {en}
}
@article{Staat2003,
  author    = {Staat, Manfred},
  title     = {Shakedown and ratchetting under tension-torsion loadings: analysis and experiments},
  year      = {2003},
  abstract  = {Structural design analyses are conducted with the aim of verifying the exclusion of ratchetting. To this end it is important to make a clear distinction between the shakedown range and the ratchetting range. The performed experiment comprised a hollow tension specimen which was subjected to alternating axial forces, superimposed with constant moments. First, a series of uniaxial tests has been carried out in order to calibrate a bounded kinematic hardening rule. The load parameters have been selected on the basis of previous shakedown analyses with the PERMAS code using a kinematic hardening material model. It is shown that this shakedown analysis gives reasonable agreement between the experimental and the numerical results. A linear and a nonlinear kinematic hardening model of two-surface plasticity are compared in material shakedown analysis.},
  subject      = {Einspielen <Werkstoff>},
  language  = {en}
}
@article{GosslaWanzek2003,
  author    = {Gossla, Ulrich and Wanzek, Thorsten},
  title     = {Seßlestalbr{\"u}cke - Verbundbr{\"u}cke mit einteiligem Querschnitt / Wanzek, Thorsten; Gossla, Ulrich},
  series = {Aktuelles aus Forschung und Praxis im Umfeld von Mechanik und Statik : Jubil{\"a}umsschrift H. Rothert / Hrsg.: Bernd Zastrau ... Technische Universit{\"a}t Dresden, Fakult{\"a}t Bauingenieurwesen, Inst. f{\"u}r Mechanik und Fl{\"a}chentragwerke},
  journal   = {Aktuelles aus Forschung und Praxis im Umfeld von Mechanik und Statik : Jubil{\"a}umsschrift H. Rothert / Hrsg.: Bernd Zastrau ... Technische Universit{\"a}t Dresden, Fakult{\"a}t Bauingenieurwesen, Inst. f{\"u}r Mechanik und Fl{\"a}chentragwerke},
  publisher = {Selbstverl. der Techn. Univ.},
  address   = {Dresden},
  pages     = {149 -- 158},
  year      = {2003},
  language  = {de}
}
@article{BienerKonertzSasse2003,
  author    = {Biener, Ernst and Konertz, K. and Sasse, T.},
  title     = {Sanierung des ehemaligen Gaswerkgel{\"a}ndes am Bremer Hauptbahnhof / K. Konertz ; E. Biener ; T. Sasse},
  series = {Handbuch Altlastensanierung und Fl{\"a}chenmanagement / hrsg. von Volker Franzius ...},
  journal   = {Handbuch Altlastensanierung und Fl{\"a}chenmanagement / hrsg. von Volker Franzius ...},
  publisher = {C.F. M{\"u}ller},
  address   = {Heidelberg},
  isbn      = {3-7685-0078-0},
  pages     = {1 -- 23},
  year      = {2003},
  language  = {de}
}
@article{Kern2003,
  author    = {Kern, Alexander},
  title     = {Risikomanagement f{\"u}r den Blitzschutz - Absch{\"a}tzung des Blitzschadensrisikos nach der neuen Vornorm VDE V 0185 Teil 2 : 2002},
  year      = {2003},
  abstract  = {Ein vorausschauendes Risikomanagement beinhaltet, Risiken zu kalkulieren. Es liefert Entscheidungsgrundlagen, um diese Risiken zu begrenzen und es macht transparent,welche Risiken sinnvoll {\"u}ber Versicherungen abgedeckt werden sollten. Bei Unternehmen, die mit umfangreichen elektronischenEinrichtungen produzieren oder Dienstleistungen erbringen (und das sind heutzutage wohl die meisten), muss auch das Risiko durch Blitzeinwirkungen besondere Ber{\"u}cksichtigung finden. Dabei ist zu beachten, dass der Schaden aufgrund der Nichtverf{\"u}gbarkeit der elektronischen Einrichtungen und damit derProduktion bzw. der Dienstleistung und ggf. der Verlust von Daten den Hardwareschaden an der betroffenen Anlage oft bei weitem {\"u}bersteigt.},
  language  = {de}
}
@article{Wolf2003,
  author    = {Wolf, Martin},
  title     = {Risiko- und Maßnahmenmanagement bei der Computervalidierung},
  series = {Pharma-Technologie-Journal (2003)},
  journal   = {Pharma-Technologie-Journal (2003)},
  publisher = {-},
  isbn      = {0931-9700},
  pages     = {50 -- 62},
  year      = {2003},
  language  = {de}
}