@article{PrumePeterRuedigeretal.2005,
  author    = {Prume, Klaus and Peter, F. and R{\"u}diger, A. and Dittmann, R.},
  title     = {Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates / Peter, F. ; R{\"u}diger, A. ; Dittmann, R. ; Waser, R. ; Szot, K. ; Reichenberg, B. ; Prume, K. ;},
  series = {Applied Physics Letters . 87 (2005), H. 8},
  journal   = {Applied Physics Letters . 87 (2005), H. 8},
  isbn      = {0003-6951},
  pages     = {082901 -- 082901-3},
  year      = {2005},
  language  = {en}
}
@article{PrumeRaederTyholdtetal.2007,
  author    = {Prume, Klaus and Raeder, H. and Tyholdt, F. and Booij, W. E.},
  title     = {Taking piezoelectric microsystems from the laboratory to production / Raeder, H. ; Tyholdt, F. ; Booij, W. ; Calame, F. ; Ostbo, N. P. ; Bredesen, R. ; Prume, K. ; Rijnders, G. ; Muralt, P.},
  series = {Journal of Electroceramics. 19 (2007), H. 4},
  journal   = {Journal of Electroceramics. 19 (2007), H. 4},
  isbn      = {1385-3449},
  pages     = {357 -- 362},
  year      = {2007},
  language  = {en}
}
@article{PrumeReichenbergRoelofsetal.2004,
  author    = {Prume, Klaus and Reichenberg, B. and Roelofs, A. and Waser, R.},
  title     = {In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.},
  series = {Journal of the European Ceramic Society. 24 (2004), H. 6},
  journal   = {Journal of the European Ceramic Society. 24 (2004), H. 6},
  isbn      = {0955-2219},
  pages     = {1145 -- 1147},
  year      = {2004},
  language  = {en}
}
@article{PrumeRoelofsSchmitzetal.2002,
  author    = {Prume, Klaus and Roelofs, Andreas and Schmitz, Thorsten and Reichenberg, Bernd},
  title     = {Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb},
  series = {Japanese Journal of Applied Physics. 41 (2002), H. 11B},
  journal   = {Japanese Journal of Applied Physics. 41 (2002), H. 11B},
  isbn      = {0021-4922},
  pages     = {7198 -- 7201},
  year      = {2002},
  language  = {en}
}
@article{PrumeTiedkeSchmitzetal.2001,
  author    = {Prume, Klaus and Tiedke, S. and Schmitz, T. and Roelofs, A.},
  title     = {Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs},
  series = {Applied Physics Letters. 79 (2001), H. 22},
  journal   = {Applied Physics Letters. 79 (2001), H. 22},
  isbn      = {0003-6951},
  pages     = {3678 -- 3680},
  year      = {2001},
  language  = {en}
}
@article{PrumeTyholdtCalameetal.2007,
  author    = {Prume, Klaus and Tyholdt, F. and Calame, F. and Raeder, H.},
  title     = {Chemically derived seeding layer for {100}-textured PZT thin films / Tyholdt, F. ; Calame, F. ; Prume, K. ; Raeder, H. ; Muralt, P.},
  series = {Journal of Electroceramics. 19 (2007), H. 4},
  journal   = {Journal of Electroceramics. 19 (2007), H. 4},
  isbn      = {1385-3449},
  pages     = {311 -- 314},
  year      = {2007},
  language  = {en}
}
@article{PrumeWaser2000,
  author    = {Prume, Klaus and Waser, Rainer},
  title     = {Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer},
  series = {Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics. Vol. 2},
  journal   = {Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics. Vol. 2},
  pages     = {675 -- 678},
  year      = {2000},
  language  = {en}
}
@article{PrumeWaserFrankenetal.2000,
  author    = {Prume, Klaus and Waser, Rainer and Franken, Klaus and Maier, Horst R.},
  title     = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;},
  series = {Journal of the American Ceramic Society. 83 (2000), H. 5},
  journal   = {Journal of the American Ceramic Society. 83 (2000), H. 5},
  isbn      = {0002-7820},
  pages     = {1153 -- 1159},
  year      = {2000},
  language  = {en}
}
@article{PrumeZalachasLaskewitzetal.2008,
  author    = {Prume, Klaus and Zalachas, Nicolas and Laskewitz, Bernd and Kamlah, Marc},
  title     = {Effective Piezoelectric Coefficients of Ferroelectric Thin Films on Elastic Substrates / Zalachas, Nicolas ; Laskewitz, Bernd ; Kamlah, Marc ; Prume, Klaus ; Lapusta, Yuri ; Tiedke, Stephan},
  series = {Journal of Intelligent Material Systems and Structures. 20 (2008), H. 6},
  journal   = {Journal of Intelligent Material Systems and Structures. 20 (2008), H. 6},
  isbn      = {1045-389X},
  pages     = {683 -- 695},
  year      = {2008},
  language  = {en}
}
@incollection{PuliniGligorevic2009,
  author    = {Pulini, Paola and Gligorevic, Snjezana},
  title     = {WIMAX performance in the airport environment},
  series = {Multi-carrier systems \& solutions 2009. (Lecture notes in electrical engineering ; 41)},
  booktitle = {Multi-carrier systems \& solutions 2009. (Lecture notes in electrical engineering ; 41)},
  publisher = {Springer},
  address   = {Berlin [u.a.]},
  isbn      = {978-90-481-2529-6 (Print) ; 978-90-481-2530-2 (Online)},
  pages     = {301 -- 310},
  year      = {2009},
  abstract  = {In this paper, the multicarrier physical layers of WiMAX are evaluated in the context of airport data links. The orthogonal frequency-division multiplexing (OFDM) and orthogonal frequency-division multiple-access (OFDMA) cases are applied to the forward link (FL) and reverse link (RL), respectively. The performance of the so called parking and taxi scenarios is presented for airport communications in C-band. Numerical results show that the proposed scheme brings good performance for both the FL and the RL. For the OFDMA case a structure changing called double-tile is also proposed to improve the system performance.},
  language  = {en}
}