@article{PrumePeterRuedigeretal.2005,
  author    = {Prume, Klaus and Peter, F. and R{\"u}diger, A. and Dittmann, R.},
  title     = {Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates / Peter, F. ; R{\"u}diger, A. ; Dittmann, R. ; Waser, R. ; Szot, K. ; Reichenberg, B. ; Prume, K. ;},
  series = {Applied Physics Letters . 87 (2005), H. 8},
  journal   = {Applied Physics Letters . 87 (2005), H. 8},
  isbn      = {0003-6951},
  pages     = {082901 -- 082901-3},
  year      = {2005},
  language  = {en}
}
@article{PrumeGerberKuegeleretal.2004,
  author    = {Prume, Klaus and Gerber, Peter and K{\"u}geler, Carsten and Roelofs, Andreas},
  title     = {Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size / Prume, K. ; Gerber, P. ; K{\"u}geler, C. ; Roelofs, A. ; B{\"o}ttger, U. ; Waser, R. ; Schmitz-Kempen,},
  isbn      = {0-7803-8410-5},
  pages     = {7 -- 10},
  year      = {2004},
  language  = {en}
}
@article{PrumeTiedkeSchmitzetal.2001,
  author    = {Prume, Klaus and Tiedke, S. and Schmitz, T. and Roelofs, A.},
  title     = {Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs},
  series = {Applied Physics Letters. 79 (2001), H. 22},
  journal   = {Applied Physics Letters. 79 (2001), H. 22},
  isbn      = {0003-6951},
  pages     = {3678 -- 3680},
  year      = {2001},
  language  = {en}
}
@article{PrumeGerberRoelofsetal.2004,
  author    = {Prume, Klaus and Gerber, P. and Roelofs, A. and K{\"u}geler, C.},
  title     = {Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; K{\"u}geler, C.; B{\"o}ttger, U. ; Waser, R. ; Prume, K. ;},
  series = {Journal of Applied Physics . 96 (2004), H. 5},
  journal   = {Journal of Applied Physics . 96 (2004), H. 5},
  isbn      = {0021-8979},
  pages     = {2800 -- 2804},
  year      = {2004},
  language  = {en}
}
@article{PrumeWaser2000,
  author    = {Prume, Klaus and Waser, Rainer},
  title     = {Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer},
  series = {Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics. Vol. 2},
  journal   = {Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics. Vol. 2},
  pages     = {675 -- 678},
  year      = {2000},
  language  = {en}
}
@article{PrumeFrankenMaieretal.2000,
  author    = {Prume, Klaus and Franken, Klaus and Maier, Horst R. and Waser, Rainer},
  title     = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer},
  series = {Journal of the American Ceramic Society. 83 (2000), H. 6},
  journal   = {Journal of the American Ceramic Society. 83 (2000), H. 6},
  isbn      = {0002-7820},
  pages     = {1433 -- 1440},
  year      = {2000},
  language  = {en}
}
@article{PrumeWaserFrankenetal.2000,
  author    = {Prume, Klaus and Waser, Rainer and Franken, Klaus and Maier, Horst R.},
  title     = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;},
  series = {Journal of the American Ceramic Society. 83 (2000), H. 5},
  journal   = {Journal of the American Ceramic Society. 83 (2000), H. 5},
  isbn      = {0002-7820},
  pages     = {1153 -- 1159},
  year      = {2000},
  language  = {en}
}
@article{PrumeReichenbergRoelofsetal.2004,
  author    = {Prume, Klaus and Reichenberg, B. and Roelofs, A. and Waser, R.},
  title     = {In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.},
  series = {Journal of the European Ceramic Society. 24 (2004), H. 6},
  journal   = {Journal of the European Ceramic Society. 24 (2004), H. 6},
  isbn      = {0955-2219},
  pages     = {1145 -- 1147},
  year      = {2004},
  language  = {en}
}
@article{PrumeFrankenBoettgeretal.2002,
  author    = {Prume, Klaus and Franken, Klaus and B{\"o}ttger, Ulrich and Waser, Rainer},
  title     = {Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; B{\"o}ttger, Ulrich ; Waser, Rainer ; Maier, Horst R.},
  series = {Journal of the European Ceramic Society. 22 (2002), H. 8},
  journal   = {Journal of the European Ceramic Society. 22 (2002), H. 8},
  isbn      = {0955-2219},
  pages     = {1285 -- 1296},
  year      = {2002},
  language  = {en}
}
@article{PrumeRoelofsSchmitzetal.2002,
  author    = {Prume, Klaus and Roelofs, Andreas and Schmitz, Thorsten and Reichenberg, Bernd},
  title     = {Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb},
  series = {Japanese Journal of Applied Physics. 41 (2002), H. 11B},
  journal   = {Japanese Journal of Applied Physics. 41 (2002), H. 11B},
  isbn      = {0021-4922},
  pages     = {7198 -- 7201},
  year      = {2002},
  language  = {en}
}