@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Calibration of network analyser measurements with leakage errors},
  series = {Electronics letters. 30 (1994), H. 1},
  journal   = {Electronics letters. 30 (1994), H. 1},
  isbn      = {0013-5194},
  pages     = {52 -- 53},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Error Corrected Impedance Measurements with a Network Analyzer},
  pages     = {125 -- 126},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique},
  series = {Conference proceedings : [Palais des Festivals et des Congr{\`e}s Cannes, France, 5 - 8 September 1994]},
  journal   = {Conference proceedings : [Palais des Festivals et des Congr{\`e}s Cannes, France, 5 - 8 September 1994]},
  publisher = {Nexus Business Communications},
  address   = {Swanley},
  isbn      = {0-9518032-5-5},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure},
  pages     = {1361 -- 1364},
  year      = {1994},
  language  = {en}
}
@article{HeuermannBaumannFauthetal.1994,
  author    = {Heuermann, Holger and Baumann, F.-M. and Fauth, G. and Albert, M.},
  title     = {Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure},
  series = {On-Line Moisture Analysis of Raw Coal},
  journal   = {On-Line Moisture Analysis of Raw Coal},
  pages     = {1361 -- 1364},
  year      = {1994},
  language  = {en}
}
@article{HeuermannStolleSchiek1995,
  author    = {Heuermann, Holger and Stolle, Reinhard and Schiek, Burkhard},
  title     = {Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B.},
  pages     = {129 -- 132},
  year      = {1995},
  language  = {en}
}
@article{HeuermannSchiek1995,
  author    = {Heuermann, Holger and Schiek, B.},
  title     = {Error corrected impedance measurements with a network analyzer},
  series = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2},
  journal   = {IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2},
  isbn      = {0018-9456},
  pages     = {295 -- 299},
  year      = {1995},
  language  = {en}
}
@article{HeuermannSchiek1995,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {The double-LNN Calibration technique for scattering parameter measurements of microstrip devices},
  series = {Conference proceedings},
  journal   = {Conference proceedings},
  publisher = {NEXUS House},
  address   = {Kent},
  pages     = {343 -- 347},
  year      = {1995},
  language  = {en}
}
@article{Heuermann1995,
  author    = {Heuermann, Holger},
  title     = {LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements},
  pages     = {129 -- 136},
  year      = {1995},
  language  = {en}
}
@article{Heuermann1996,
  author    = {Heuermann, Holger},
  title     = {Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures},
  pages     = {136 -- 145},
  year      = {1996},
  language  = {en}
}