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Anthony Seibert}, publisher = {IEEE Operations Center}, address = {Piscataway, NJ}, issn = {1082-3654}, pages = {2430 -- 2433}, year = {2004}, language = {en} } @article{PrumeFrankenMaieretal.2000, author = {Prume, Klaus and Franken, Klaus and Maier, Horst R. and Waser, Rainer}, title = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer}, series = {Journal of the American Ceramic Society. 83 (2000), H. 6}, journal = {Journal of the American Ceramic Society. 83 (2000), H. 6}, isbn = {0002-7820}, pages = {1433 -- 1440}, year = {2000}, language = {en} } @article{PrumeWaserFrankenetal.2000, author = {Prume, Klaus and Waser, Rainer and Franken, Klaus and Maier, Horst R.}, title = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;}, series = {Journal of the American Ceramic Society. 83 (2000), H. 5}, journal = {Journal of the American Ceramic Society. 83 (2000), H. 5}, isbn = {0002-7820}, pages = {1153 -- 1159}, year = {2000}, language = {en} } @article{PrumeReichenbergRoelofsetal.2004, author = {Prume, Klaus and Reichenberg, B. and Roelofs, A. and Waser, R.}, title = {In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.}, series = {Journal of the European Ceramic Society. 24 (2004), H. 6}, journal = {Journal of the European Ceramic Society. 24 (2004), H. 6}, isbn = {0955-2219}, pages = {1145 -- 1147}, year = {2004}, language = {en} } @article{PrumeFrankenBoettgeretal.2002, author = {Prume, Klaus and Franken, Klaus and B{\"o}ttger, Ulrich and Waser, Rainer}, title = {Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; B{\"o}ttger, Ulrich ; Waser, Rainer ; Maier, Horst R.}, series = {Journal of the European Ceramic Society. 22 (2002), H. 8}, journal = {Journal of the European Ceramic Society. 22 (2002), H. 8}, isbn = {0955-2219}, pages = {1285 -- 1296}, year = {2002}, language = {en} } @article{PrumeRoelofsSchmitzetal.2002, author = {Prume, Klaus and Roelofs, Andreas and Schmitz, Thorsten and Reichenberg, Bernd}, title = {Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb}, series = {Japanese Journal of Applied Physics. 41 (2002), H. 11B}, journal = {Japanese Journal of Applied Physics. 41 (2002), H. 11B}, isbn = {0021-4922}, pages = {7198 -- 7201}, year = {2002}, language = {en} } @article{PrumeMeyerWaseretal.2005, author = {Prume, Klaus and Meyer, Ren{\´e} and Waser, Rainer and Schmitz, Torsten}, title = {Dynamic leakage current compensation in ferroelectric thin-film capacitor structures / Meyer, Ren{\´e} ; Waser, Rainer ; Prume, Klaus ; Schmitz, Torsten ; Tiedke, Stephan}, series = {Applied Physics Letters . 86 (2005), H. 14}, journal = {Applied Physics Letters . 86 (2005), H. 14}, isbn = {0003-6951}, pages = {142907-1 -- 142907-3}, year = {2005}, language = {en} }