@article{PrumeRoelofsSchmitzetal.2002,
  author    = {Prume, Klaus and Roelofs, Andreas and Schmitz, Thorsten and Reichenberg, Bernd},
  title     = {Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb},
  series = {Japanese Journal of Applied Physics. 41 (2002), H. 11B},
  journal   = {Japanese Journal of Applied Physics. 41 (2002), H. 11B},
  isbn      = {0021-4922},
  pages     = {7198 -- 7201},
  year      = {2002},
  language  = {en}
}
@article{PrumeReichenbergRoelofsetal.2004,
  author    = {Prume, Klaus and Reichenberg, B. and Roelofs, A. and Waser, R.},
  title     = {In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.},
  series = {Journal of the European Ceramic Society. 24 (2004), H. 6},
  journal   = {Journal of the European Ceramic Society. 24 (2004), H. 6},
  isbn      = {0955-2219},
  pages     = {1145 -- 1147},
  year      = {2004},
  language  = {en}
}
@article{PrumeRaederTyholdtetal.2007,
  author    = {Prume, Klaus and Raeder, H. and Tyholdt, F. and Booij, W. E.},
  title     = {Taking piezoelectric microsystems from the laboratory to production / Raeder, H. ; Tyholdt, F. ; Booij, W. ; Calame, F. ; Ostbo, N. P. ; Bredesen, R. ; Prume, K. ; Rijnders, G. ; Muralt, P.},
  series = {Journal of Electroceramics. 19 (2007), H. 4},
  journal   = {Journal of Electroceramics. 19 (2007), H. 4},
  isbn      = {1385-3449},
  pages     = {357 -- 362},
  year      = {2007},
  language  = {en}
}
@article{PrumePeterRuedigeretal.2005,
  author    = {Prume, Klaus and Peter, F. and R{\"u}diger, A. and Dittmann, R.},
  title     = {Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates / Peter, F. ; R{\"u}diger, A. ; Dittmann, R. ; Waser, R. ; Szot, K. ; Reichenberg, B. ; Prume, K. ;},
  series = {Applied Physics Letters . 87 (2005), H. 8},
  journal   = {Applied Physics Letters . 87 (2005), H. 8},
  isbn      = {0003-6951},
  pages     = {082901 -- 082901-3},
  year      = {2005},
  language  = {en}
}
@article{PrumeMuraltCalameetal.2007,
  author    = {Prume, Klaus and Muralt, Paul and Calame, Florian and Schmitz-Kempen, Thorsten},
  title     = {Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals / Prume, Klaus ; Muralt, Paul ; Calame, Florian ; Schmitz-Kempen, Thorsten ; Tiedke, Stephan},
  series = {Journal of Electroceramics. 19 (2007), H. 4},
  journal   = {Journal of Electroceramics. 19 (2007), H. 4},
  isbn      = {1385-3449},
  pages     = {407 -- 411},
  year      = {2007},
  language  = {en}
}
@article{PrumeMuraltCalameetal.2007,
  author    = {Prume, Klaus and Muralt, P. and Calame, F. and Schmitz-Kempen, T.},
  title     = {Piezoelectric thin films: evaluation of electrical and electromechanical characteristics for MEMS devices / Prume, K. ; Muralt, P. ; Calame, F. ; Schmitz-Kempen, T. ; Tiedke, S. ;},
  series = {IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control. 54 (2007), H. 1},
  journal   = {IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control. 54 (2007), H. 1},
  isbn      = {0885-3010},
  pages     = {81 -- 14},
  year      = {2007},
  language  = {en}
}
@article{PrumeMeyerWaseretal.2005,
  author    = {Prume, Klaus and Meyer, Ren{\´e} and Waser, Rainer and Schmitz, Torsten},
  title     = {Dynamic leakage current compensation in ferroelectric thin-film capacitor structures / Meyer, Ren{\´e} ; Waser, Rainer ; Prume, Klaus ; Schmitz, Torsten ; Tiedke, Stephan},
  series = {Applied Physics Letters . 86 (2005), H. 14},
  journal   = {Applied Physics Letters . 86 (2005), H. 14},
  isbn      = {0003-6951},
  pages     = {142907-1 -- 142907-3},
  year      = {2005},
  language  = {en}
}
@article{PrumeGerberKuegeleretal.2004,
  author    = {Prume, Klaus and Gerber, Peter and K{\"u}geler, Carsten and Roelofs, Andreas},
  title     = {Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size / Prume, K. ; Gerber, P. ; K{\"u}geler, C. ; Roelofs, A. ; B{\"o}ttger, U. ; Waser, R. ; Schmitz-Kempen,},
  isbn      = {0-7803-8410-5},
  pages     = {7 -- 10},
  year      = {2004},
  language  = {en}
}
@article{PrumeGerberRoelofsetal.2004,
  author    = {Prume, Klaus and Gerber, P. and Roelofs, A. and K{\"u}geler, C.},
  title     = {Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; K{\"u}geler, C.; B{\"o}ttger, U. ; Waser, R. ; Prume, K. ;},
  series = {Journal of Applied Physics . 96 (2004), H. 5},
  journal   = {Journal of Applied Physics . 96 (2004), H. 5},
  isbn      = {0021-8979},
  pages     = {2800 -- 2804},
  year      = {2004},
  language  = {en}
}
@article{PrumeFrankenMaieretal.2000,
  author    = {Prume, Klaus and Franken, Klaus and Maier, Horst R. and Waser, Rainer},
  title     = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer},
  series = {Journal of the American Ceramic Society. 83 (2000), H. 6},
  journal   = {Journal of the American Ceramic Society. 83 (2000), H. 6},
  isbn      = {0002-7820},
  pages     = {1433 -- 1440},
  year      = {2000},
  language  = {en}
}