@article{BreitbachNickelSchubert1990, author = {Breitbach, Gerd and Nickel, H. and Schubert, F.}, title = {Stand der Aktivit{\"a}ten zu Regelwerken f{\"u}r heliumgek{\"u}hlte Hochtemperaturreaktoren / H. Nickel ; F. Schubert ; G. Breitbach}, series = {Atomwirtschaft - Atomtechnik. 35 (1990), H. 2}, journal = {Atomwirtschaft - Atomtechnik. 35 (1990), H. 2}, isbn = {0004-721x}, pages = {74 -- 79}, year = {1990}, language = {de} } @article{DielmannBockSonnek2007, author = {Dielmann, Klaus-Peter and Bock, Alexis and Sonnek, Frederic}, title = {Stand der CO2-Allokationspl{\"a}ne in Europa und Durchsetzung der Monitoring-Richtlinien}, series = {VGB PowerTech : international journal for electricity and heat generation}, volume = {87}, journal = {VGB PowerTech : international journal for electricity and heat generation}, number = {3}, isbn = {1435-3199}, pages = {40 -- 46}, year = {2007}, language = {de} } @article{HaissigDoerenWilmes1981, author = {Haissig, Manfred and D{\"o}ren, Horst-Peter and Wilmes, S.}, title = {Stand der Entwicklung des Horizontal-Stranggießens von Edelstahl bei der B{\"o}hler AG}, series = {Stahl und Eisen. Zeitschrift f{\"u}r die Herstellung und Verarbeitung von Eisen und Stahl. Hrsg.: Verein Deutscher Eisenh{\"u}ttenleute (VDEh) ; Wirtschaftsvereinigung Stahl. 101 (1981), H. 6}, journal = {Stahl und Eisen. Zeitschrift f{\"u}r die Herstellung und Verarbeitung von Eisen und Stahl. Hrsg.: Verein Deutscher Eisenh{\"u}ttenleute (VDEh) ; Wirtschaftsvereinigung Stahl. 101 (1981), H. 6}, issn = {0340-4803}, pages = {383 -- 390}, year = {1981}, language = {de} } @article{VerschitzButenweg2014, author = {Verschitz, Daniel and Butenweg, Christoph}, title = {Standsicherheitsnachweis von Beh{\"a}ltern f{\"u}r Kleinkl{\"a}ranlagen}, series = {ACWA aktuell}, journal = {ACWA aktuell}, number = {12 - 9/2014}, publisher = {RWTH Aachen}, address = {Aachen}, pages = {10}, year = {2014}, abstract = {Die PIA GmbH pr{\"u}ft seit fast 8 Jahren die Standsicherheit von Beh{\"a}ltern f{\"u}r Kleinkl{\"a}ranlagen. Diese bestehen in der Regel aus Kunststoff oder Beton und m{\"u}ssen {\"u}ber ihre gesamte Lebensdauer den Beanspruchungen aus Handhabung, Einbau und Betrieb standhalten. Die Standsicherheit kann nach EN 12566 wahlweise durch einen rechnerischen Nachweis oder durch einen praktischen Nachweis wie die Bruchlastpr{\"u}fung oder die Pr{\"u}fung in der Grube erfolgen.}, language = {de} } @article{FoersterOhlerMoers1993, author = {F{\"o}rster, Arnold and Ohler, C. and Moers, J.}, title = {Strain dependence of the valence-band offset in arsenide compound heterojunctions determined by photoelectron spectroscopy / C. Ohler ; J. Moers ; A. F{\"o}rster ...}, series = {Journal of Vacuum Science \& Technology B: Microelectronics and Nanometer Structures. 13 (1993), H. 4}, journal = {Journal of Vacuum Science \& Technology B: Microelectronics and Nanometer Structures. 13 (1993), H. 4}, isbn = {1071-1023}, pages = {1728 -- 1735}, year = {1993}, language = {en} } @article{FoersterOhlerKohleick1994, author = {F{\"o}rster, Arnold and Ohler, C. and Kohleick, R.}, title = {Strain dependence of the valence-band offset in InAs/GaAs heterojunctions determined by ultraviolet photoelectron spectroscopy / C. Ohler ; R. Kohleick ; A. F{\"o}rster ...}, series = {Physical Review B . 50 (1994), H. 11}, journal = {Physical Review B . 50 (1994), H. 11}, isbn = {0163-1829}, pages = {7833 -- 7837}, year = {1994}, language = {en} } @article{FoersterRosenauerRemmele1997, author = {F{\"o}rster, Arnold and Rosenauer, A. and Remmele, T.}, title = {Strain determination in mismatched semiconductor heterostructures by the digital analysis of lattice images / A. Rosenauer ; T. Remmele ; U. Fischer ; A. F{\"o}rster ...}, series = {Microscopy of semiconducting materials 1997 : proceedings of the Royal Microscopical Society Conference held at Oxford University, 7 - 10 April 1997 / ed. by A. G. Cullis ... - (Conference series / Institute of Physics ; 157)}, journal = {Microscopy of semiconducting materials 1997 : proceedings of the Royal Microscopical Society Conference held at Oxford University, 7 - 10 April 1997 / ed. by A. G. Cullis ... - (Conference series / Institute of Physics ; 157)}, publisher = {Institute of Physics}, address = {Bristol [u.a.]}, isbn = {0-7503-0464-2}, pages = {39 -- ff.}, year = {1997}, language = {en} } @article{FoersterLentzenGerthsen1995, author = {F{\"o}rster, Arnold and Lentzen, M. and Gerthsen, D.}, title = {Strain relaxation of lattice-mismatched In0.2Ga0.8As/GaAs superlattices on GaAs(001) substrates / M. Lentzen ; D. Gerthsen ; A. F{\"o}rster ...}, series = {Microscopy of semiconducting materials 1995 : proceedings of the Institute of Physics Conference held at Oxford University, 20 - 23 March 1995 / Ed. by A G Cullis ... - (Conference series / Institute of Physics ; 146)}, journal = {Microscopy of semiconducting materials 1995 : proceedings of the Institute of Physics Conference held at Oxford University, 20 - 23 March 1995 / Ed. by A G Cullis ... - (Conference series / Institute of Physics ; 146)}, publisher = {Institute of Physics}, address = {Bristol [u.a.]}, isbn = {0-7503-0347-6}, pages = {357 -- ff.}, year = {1995}, language = {en} } @article{RosenauerOberstLitvinovetal.2000, author = {Rosenauer, A. and Oberst, W. and Litvinov, D. and Gerthsen, D. and F{\"o}rster, Arnold and Schmidt, R.}, title = {Structural and Chemical Investigation of In-0.6Ga0.4As Stranski-Krastanow Layers Burried in GaAs by Transmission Electron Microscopy}, series = {Physical Review B. 61 (2000), H. 12}, journal = {Physical Review B. 61 (2000), H. 12}, isbn = {1095-3795}, pages = {8276 -- 8288}, year = {2000}, language = {en} } @article{FoersterTillmannGerthsenetal.1995, author = {F{\"o}rster, Arnold and Tillmann, K. and Gerthsen, D. and Pfundstein, P.}, title = {Structural transformations and strain relaxation mechanisms of In0.6Ga0.4As islands grown by molecular beam epitaxy on GaAs(001) substrates / Tillmann, K. ; Gerthsen, D. ; Pfundstein, P. ; F{\"o}rster, A. ; Urban, K.}, series = {Journal of applied physics. 78 (1995), H. 6}, journal = {Journal of applied physics. 78 (1995), H. 6}, isbn = {0021-8979}, pages = {3824 -- 3832}, year = {1995}, language = {en} }