@article{KernWiesingerZischank1991,
  author    = {Kern, Alexander and Wiesinger, J. and Zischank, Wolfgang J.},
  title     = {Calculation of the longitudinal voltage along metal tubes caused by lightning currents and protection measures},
  series = {Seventh International Symposium on High Voltage Engineering : Dresden, August 26 - 30 1991},
  journal   = {Seventh International Symposium on High Voltage Engineering : Dresden, August 26 - 30 1991},
  publisher = {Techn. Univ.},
  address   = {Dresden},
  year      = {1991},
  language  = {en}
}
@article{KernSchelthoffMathieu2011,
  author    = {Kern, Alexander and Schelthoff, Christof and Mathieu, Moritz},
  title     = {Calculation of interception efficiencies for airterminations using a dynamic electro-geometrical model},
  publisher = {IEEE},
  address   = {New York},
  pages     = {1 -- 6},
  year      = {2011},
  language  = {en}
}
@article{HeelDiktaBraekers2021,
  author    = {Heel, Mareike van and Dikta, Gerhard and Braekers, Roel},
  title     = {Bootstrap based goodness‑of‑fit tests for binary multivariate regression models},
  series = {Journal of the Korean Statistical Society},
  volume    = {51},
  journal   = {Journal of the Korean Statistical Society},
  publisher = {Springer Nature},
  address   = {Singapur},
  issn      = {2005-2863 (Online)},
  doi       = {10.1007/s42952-021-00142-4},
  pages     = {28 Seiten},
  year      = {2021},
  abstract  = {We consider a binary multivariate regression model where the conditional expectation of a binary variable given a higher-dimensional input variable belongs to a parametric family. Based on this, we introduce a model-based bootstrap (MBB) for higher-dimensional input variables. This test can be used to check whether a sequence of independent and identically distributed observations belongs to such a parametric family. The approach is based on the empirical residual process introduced by Stute (Ann Statist 25:613-641, 1997). In contrast to Stute and Zhu's approach (2002) Stute \& Zhu (Scandinavian J Statist 29:535-545, 2002), a transformation is not required. Thus, any problems associated with non-parametric regression estimation are avoided. As a result, the MBB method is much easier for users to implement. To illustrate the power of the MBB based tests, a small simulation study is performed. Compared to the approach of Stute \& Zhu (Scandinavian J Statist 29:535-545, 2002), the simulations indicate a slightly improved power of the MBB based method. Finally, both methods are applied to a real data set.},
  language  = {en}
}
@article{RateikeSiebourgSchmidetal.1990,
  author    = {Rateike, Franz-Matthias and Siebourg, W. and Schmid, H. and Anders, S.},
  title     = {Birefringence - An important property of plastic substrates for magneto-optical storage disks / W. Siebourg ; H. Schmid ; F. M. Rateike ; S. Anders ; U. Grigo ; H. L{\"o}wer},
  series = {Polymer engineering \& science / Society of Plastics Engineers. 30 (1990), H. 18},
  journal   = {Polymer engineering \& science / Society of Plastics Engineers. 30 (1990), H. 18},
  isbn      = {0032-3888},
  pages     = {1133 -- 1139},
  year      = {1990},
  language  = {en}
}
@article{DarmoSchaefferFoersteretal.2000,
  author    = {Darmo, J. and Sch{\"a}ffer, F. and F{\"o}rster, Arnold and Kordos, P.},
  title     = {Beryllium doped low-temperature-grown MBE GaAs: material for photomixing in the THz frequency range},
  series = {ASDAM 2000 : conference proceedings / edited by Jozef Osvald ... [et al.]},
  journal   = {ASDAM 2000 : conference proceedings / edited by Jozef Osvald ... [et al.]},
  publisher = {IEEE},
  address   = {Piscataway, NJ},
  isbn      = {0780359399},
  pages     = {147 -- 150},
  year      = {2000},
  language  = {en}
}
@article{FoersterOhlerDaniels1997,
  author    = {F{\"o}rster, Arnold and Ohler, C. and Daniels, C.},
  title     = {Barrier height at clean Au/InAs(100) interfaces / C. Ohler ; C. Daniels ; A. F{\"o}rster ...},
  series = {Journal of Vacuum Science \& Technology B: Microelectronics and Nanometer Structures. 15 (1997), H. 3},
  journal   = {Journal of Vacuum Science \& Technology B: Microelectronics and Nanometer Structures. 15 (1997), H. 3},
  isbn      = {0169-4332},
  pages     = {702 -- 706},
  year      = {1997},
  language  = {en}
}
@article{FoersterOhlerMoers1997,
  author    = {F{\"o}rster, Arnold and Ohler, C. and Moers, J.},
  title     = {Band offsets at heavily strained III - V interfaces / C. Ohler ; A. F{\"o}rster ; J. Moers...},
  series = {Journal of Physics D: Applied Physics. 30 (1997), H. 10},
  journal   = {Journal of Physics D: Applied Physics. 30 (1997), H. 10},
  isbn      = {0022-3727},
  pages     = {1436 -- 1441},
  year      = {1997},
  language  = {en}
}
@article{MarxSchenkBehrensetal.2013,
  author    = {Marx, Ulrich and Schenk, Friedrich and Behrens, Jan and Meyr, Ulrike and Wanek, Paul and Zang, Werner and Schmitt, Robert and Br{\"u}stle, Oliver and Zenke, Martin and Klocke, Fritz},
  title     = {Automatic production of induced pluripotent stem cells},
  series = {Procedia CIRP : First CIRP Conference on BioManufacturing},
  volume    = {Vol. 5},
  journal   = {Procedia CIRP : First CIRP Conference on BioManufacturing},
  publisher = {Elsevier},
  address   = {Amsterdam},
  issn      = {2212-8271},
  pages     = {2 -- 6},
  year      = {2013},
  language  = {en}
}
@article{FoersterRosenauerRemmele1997,
  author    = {F{\"o}rster, Arnold and Rosenauer, A. and Remmele, T.},
  title     = {Atomic scale strain measurements by the digital analysis of transmission electron microscopic lattice images / A. Rosenauer ; T. Remmele ; D. Gerthsen ... A. F{\"o}rster},
  series = {Optik : international journal for light and electron optics. 105 (1997), H. 3},
  journal   = {Optik : international journal for light and electron optics. 105 (1997), H. 3},
  isbn      = {0030-4026},
  pages     = {99 -- 107},
  year      = {1997},
  language  = {en}
}
@article{FoersterRosenauerOberstetal.1999,
  author    = {F{\"o}rster, Arnold and Rosenauer, A. and Oberst, W. and Gerthsen, D.},
  title     = {Atomic scale analysis of the indium distribution in InGaAs/GaAs (001) heterostructures: segregation, lateral indium redistribution and the effect of growth interruptions. Rosenauer, A. ; Oberst, W. ; Gerthsen, D. ; F{\"o}rster, A.},
  series = {Thin Solid Films. 357 (1999)},
  journal   = {Thin Solid Films. 357 (1999)},
  isbn      = {0040-6090},
  pages     = {18 -- 21},
  year      = {1999},
  language  = {en}
}