@article{Schoening2000,
  author    = {Sch{\"o}ning, Michael Josef},
  title     = {Silicon recognizes biochemical parameters: Microchips for analytical sensor applications},
  series = {American Laboratory. 32 (2000), H. 16},
  journal   = {American Laboratory. 32 (2000), H. 16},
  isbn      = {0044-7749},
  pages     = {24 -- 31},
  year      = {2000},
  language  = {en}
}
@article{TillmannFoerster2000,
  author    = {Tillmann, K. and F{\"o}rster, Arnold},
  title     = {Critical dimensions for the formation of interfacial misfit dislocations of In0.6Ga0.4As islands on GaAs(001)},
  series = {Thin Solid Films. 368 (2000), H. 1},
  journal   = {Thin Solid Films. 368 (2000), H. 1},
  isbn      = {0040-6090},
  pages     = {93 -- 104},
  year      = {2000},
  language  = {en}
}
@article{VitusevichFoersterReetzetal.2000,
  author    = {Vitusevich, S. A. and F{\"o}rster, Arnold and Reetz, W. and L{\"u}th, H. and Belyaev, A. E. and Danylyuk, S. V.},
  title     = {Spectral Responsivity of single-quantum-well photodetectors},
  series = {Applied Physics Letters. 77 (2000), H. 1},
  journal   = {Applied Physics Letters. 77 (2000), H. 1},
  isbn      = {1077-3118},
  pages     = {16 -- 18},
  year      = {2000},
  language  = {en}
}
@article{VitusevichFoersterIndlekoferetal.2000,
  author    = {Vitusevich, S. A. and F{\"o}rster, Arnold and Indlekofer, K.-M. and L{\"u}th, H. and Belyaev, A. E. and Glavin, B. A. and Konakova, R. V.},
  title     = {Tunneling Through X-Valley-Related Impurity States in GaAs/AlAs Resonant-Tunneling Diodes},
  series = {Physical Review . B. 61 (2000), H. 16},
  journal   = {Physical Review . B. 61 (2000), H. 16},
  isbn      = {1550-235X},
  pages     = {10898 -- 10904},
  year      = {2000},
  language  = {en}
}
@article{MuellerVeggianCesariConteetal.2000,
  author    = {M{\"u}ller-Veggian, Mattea and Cesari, V. and Conte, V. and De Nardo, L.},
  title     = {TEPCs working at nanometre level},
  series = {Annual report / Istituto Nazionale di Fisica Nucleare, LNL, Laboratori Nazionali di Legnaro. 1999 (2000)},
  journal   = {Annual report / Istituto Nazionale di Fisica Nucleare, LNL, Laboratori Nazionali di Legnaro. 1999 (2000)},
  pages     = {117},
  year      = {2000},
  language  = {en}
}
@article{SelmerKahntGoubeaudetal.2000,
  author    = {Selmer, Thorsten and Kahnt, J{\"o}rg and Goubeaud, Marcel and Shima, Seigo},
  title     = {The biosynthesis of methylated amino acids in the active site region of methyl-coenzyme M reductase / Selmer, Thorsten ; Kahnt, J{\"o}rg ; Goubeaud, Marcel ; Shima, Seigo ; Grabarse, Wolfgang ; Ermler, Ulrich ; Thauer, Rudolf K.},
  series = {Journal of Biological Chemistry. 275 (2000), H. 6},
  journal   = {Journal of Biological Chemistry. 275 (2000), H. 6},
  isbn      = {1083-351X},
  pages     = {3775 -- 3760},
  year      = {2000},
  language  = {en}
}
@article{SelmerBrueserDahl2000,
  author    = {Selmer, Thorsten and Br{\"u}ser, Thomas and Dahl, Christiane},
  title     = {ADP Sulfurylase" from Thiobacillus denitrificans Is an Adenylylsulfate:Phosphate Adenylyltransferase and Belongs to a New Family of Nucleotidyltransferases / Br{\"u}ser, Thomas ; Selmer, Thorsten ; Dahl, Christiane},
  series = {Journal of Biological Chemistry. 275 (2000), H. 3},
  journal   = {Journal of Biological Chemistry. 275 (2000), H. 3},
  isbn      = {1083-351X},
  pages     = {1691 -- 1690},
  year      = {2000},
  language  = {en}
}
@article{PrumeFrankenMaieretal.2000,
  author    = {Prume, Klaus and Franken, Klaus and Maier, Horst R. and Waser, Rainer},
  title     = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer},
  series = {Journal of the American Ceramic Society. 83 (2000), H. 6},
  journal   = {Journal of the American Ceramic Society. 83 (2000), H. 6},
  isbn      = {0002-7820},
  pages     = {1433 -- 1440},
  year      = {2000},
  language  = {en}
}
@article{PrumeWaserFrankenetal.2000,
  author    = {Prume, Klaus and Waser, Rainer and Franken, Klaus and Maier, Horst R.},
  title     = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;},
  series = {Journal of the American Ceramic Society. 83 (2000), H. 5},
  journal   = {Journal of the American Ceramic Society. 83 (2000), H. 5},
  isbn      = {0002-7820},
  pages     = {1153 -- 1159},
  year      = {2000},
  language  = {en}
}
@article{PrumeWaser2000,
  author    = {Prume, Klaus and Waser, Rainer},
  title     = {Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer},
  series = {Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics. Vol. 2},
  journal   = {Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics. Vol. 2},
  pages     = {675 -- 678},
  year      = {2000},
  language  = {en}
}