@incollection{HelsperDressler2012, author = {Helsper, Christoph and Dressler, J{\"o}rg}, title = {Partikelmesstechnik}, series = {Reinraumtechnik}, volume = {2012}, booktitle = {Reinraumtechnik}, editor = {Gail, Lothar and Gommel, Udo and Hortig, Hans-Peter}, edition = {3}, publisher = {Springer}, address = {Berlin}, isbn = {978-3-642-19435-1}, doi = {10.1007/978-3-642-19435-1_3}, pages = {69 -- 95}, year = {2012}, abstract = {Der Schutz von Produkten vor der Kontamination durch Partikel gilt als eine zentrale Aufgabe der Reinraumtechnik. Da es dabei um Kontaminationseffekte weit unterhalb der visuellen Wahrnehmbarkeit geht, braucht es leistungsf{\"a}hige Verfahren, um die Messgr{\"o}ße „Partikelkontamination" {\"u}ber den gesamten Bereich, den Anwender fordern, pr{\"a}zise zu bestimmen. Neben der Partikelh{\"a}ufigkeit ist dabei die Gr{\"o}ße der Partikel, die sowohl das Transportverhalten wie auch die m{\"o}gliche Wirkung auf das Produkt beeinflusst, von entscheidender Bedeutung. Ferner kann es f{\"u}r die Ermittlung von Kontaminationsquellen von Interesse sein, die Form und die chemische Natur der Partikel zu bestimmen (z. B. textile Fasern, Metallabrieb, fl{\"u}ssige Tr{\"o}pfchen). Die Partikelh{\"a}ufigkeit wird {\"u}blicherweise als Konzentration, d. h. bezogen auf das analysierte Gasvolumen angegeben. Bei den in reinen Technologien {\"u}blichen niedrigen Konzentrationen dient als H{\"a}ufigkeitsmaß die Partikelanzahlkonzentration, also die Partikelanzahl pro Volumeneinheit des Tr{\"a}germediums.}, language = {de} } @article{Pieper2009, author = {Pieper, Martin}, title = {Vector hyperinterpolation on the sphere}, series = {Journal of approximation theory. 156 (2009), H. 2}, journal = {Journal of approximation theory. 156 (2009), H. 2}, isbn = {0021-9045}, pages = {173 -- 186}, year = {2009}, language = {en} } @article{VitusevichFoersterLuethetal.2001, author = {Vitusevich, S. A. and F{\"o}rster, Arnold and L{\"u}th, H. and Belyaev, A. E. and Danylyuk, S. V. and Konakova, R. V. and Sheka, D. I.}, title = {Resonant spectroscopy of electric-field-induced superlattices}, series = {Journal of Applied Physics. 90 (2001), H. 6}, journal = {Journal of Applied Physics. 90 (2001), H. 6}, isbn = {1089-7550}, doi = {10.1063/1.1392956}, pages = {2857 -- 2861}, year = {2001}, language = {en} } @article{StockMalindretosIndlekoferetal.2001, author = {Stock, J. and Malindretos, J. and Indlekofer, K.M. and P{\"o}ttgens, Michael and F{\"o}rster, Arnold and L{\"u}th, Hans}, title = {A Vertical Resonant Tunneling Transistor for Application in Digital Logic Circuits}, series = {IEEE Transactions on Electron Devices (T-ED). 48 (2001), H. 6}, journal = {IEEE Transactions on Electron Devices (T-ED). 48 (2001), H. 6}, isbn = {0018-9383}, pages = {1028 -- 1032}, year = {2001}, language = {en} } @article{SchwarzerSchlenger1988, author = {Schwarzer, Klemens and Schlenger, Barbara J.}, title = {Investigation of fission product aerosol behavior in an HTR containment during severe core-heatup accidents / Barbara J. Schlenger ; K. Schwarzer}, series = {Tagungsbericht : Maritim Kongresszentrum, 17. - 19. Mai '88 Travem{\"u}nde / Kerntechnische Gesellschaft e.V.; Deutsches Atomforum e.V. [Red.: K. G. Bauer]}, journal = {Tagungsbericht : Maritim Kongresszentrum, 17. - 19. Mai '88 Travem{\"u}nde / Kerntechnische Gesellschaft e.V.; Deutsches Atomforum e.V. [Red.: K. G. Bauer]}, publisher = {Inforum}, address = {Bonn}, isbn = {0720-9207}, pages = {179 -- 182}, year = {1988}, language = {en} } @book{SchwarzerAltes1983, author = {Schwarzer, Klemens and Altes, J.}, title = {Zum St{\"o}rungsverhalten des HTR 500 : eine Trendanalyse ; [Report] / von J. Altes ... K. Schwarzer ... - (Spezielle Berichte der Kernforschungsanlage J{\"u}lich ; 220)}, publisher = {Zentralbibliothek der Kernforschungsanlage}, address = {J{\"u}lich}, pages = {41 S. : graph. Darst.}, year = {1983}, language = {de} } @article{SchwarzerEhrhardtBayeretal.1982, author = {Schwarzer, Klemens and Ehrhardt, J. and Bayer, A. and Kroeger, W.}, title = {Unfallfolgen- und Risikoabsch{\"a}tzung f{\"u}r die probabilistische HTR-1160-Sicherheitsstudie / J. Ehrhardt ; A. Bayer ; W. Kroeger ; K. Schwarzer}, series = {Atomwirtschaft - Atomtechnik. 27 (1982), H. 10}, journal = {Atomwirtschaft - Atomtechnik. 27 (1982), H. 10}, isbn = {0004-721x}, pages = {527 -- 529}, year = {1982}, language = {de} } @article{HodelOrzatiMarsoetal.2000, author = {Hodel, U. and Orzati, A. and Marso, M. and Homann, O. and Fox, A. and Hart, A. v. d. and F{\"o}rster, Arnold and Kordos, P. and L{\"u}th, H.}, title = {A novel InAlAs/InGaAs layer structure for monolithically integrated photoreceiver}, series = {Conference Proceedings: 2000 International Conference on Indium Phosphide and related materials}, journal = {Conference Proceedings: 2000 International Conference on Indium Phosphide and related materials}, publisher = {IEEE Service Center}, address = {Piscataway, NJ}, isbn = {0-7803-6320-5}, pages = {466 -- 469}, year = {2000}, language = {en} } @article{HoskensRoerTolstikhinetal.2000, author = {Hoskens, R.C.P. and Roer, T.G. van de and Tolstikhin, V.I. and F{\"o}rster, Arnold}, title = {Hot electron injection laser: vertically integrated transistor-laser structure for high-speed, low-chirp direct modulation}, series = {LEOS 2000 : 2000 IEEE annual meeting conference proceedings; 13th annual meeting; IEEE Lasers and Electro-Optics Society 2000 annual meeting; 13-16 November 2000, The Westin Rio Mar Beach, Rio Grande, Puerto Rico. Vol. 2}, journal = {LEOS 2000 : 2000 IEEE annual meeting conference proceedings; 13th annual meeting; IEEE Lasers and Electro-Optics Society 2000 annual meeting; 13-16 November 2000, The Westin Rio Mar Beach, Rio Grande, Puerto Rico. Vol. 2}, publisher = {IEEE Service Center}, address = {Piscataway, NJ}, isbn = {0-7803-5947-X}, pages = {444 -- 445}, year = {2000}, language = {en} } @article{HoskensTolstikhinFoersteretal.2000, author = {Hoskens, R. C. P. and Tolstikhin, V.I. and F{\"o}rster, Arnold and Roer, T.G. van de}, title = {Vertically integrated transistor-laser structure, take 2}, series = {WOCSDICE 2000, 24th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe : May 29 - June 02, 2000, Aegean Sea, Greece.}, journal = {WOCSDICE 2000, 24th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe : May 29 - June 02, 2000, Aegean Sea, Greece.}, publisher = {Univ. of Michigan}, address = {Ann Arbor, Mich.}, isbn = {0970311109}, pages = {Getr. Z{\"a}hlung [ca. 200 S.]}, year = {2000}, language = {en} }