@article{PrumeBooijVogletal.2007, author = {Prume, Klaus and Booij, W. E. and Vogl, A. H. and Wang, D. T.}, title = {A simple and powerful analytical model for MEMS piezoelectric multimorphs / Booij, W. E. ; Vogl, A. H. ; Wang, D. T. ; Tyholdt, F. ; Ostbo, N. P. ; Raeder, H. ; Prume, K.}, series = {Journal of Electroceramics. 19 (2007), H. 4}, journal = {Journal of Electroceramics. 19 (2007), H. 4}, isbn = {1385-3449}, pages = {387 -- 393}, year = {2007}, language = {en} } @article{PrumePeterRuedigeretal.2005, author = {Prume, Klaus and Peter, F. and R{\"u}diger, A. and Dittmann, R.}, title = {Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates / Peter, F. ; R{\"u}diger, A. ; Dittmann, R. ; Waser, R. ; Szot, K. ; Reichenberg, B. ; Prume, K. ;}, series = {Applied Physics Letters . 87 (2005), H. 8}, journal = {Applied Physics Letters . 87 (2005), H. 8}, isbn = {0003-6951}, pages = {082901 -- 082901-3}, year = {2005}, language = {en} } @article{PrumeTyholdtCalameetal.2007, author = {Prume, Klaus and Tyholdt, F. and Calame, F. and Raeder, H.}, title = {Chemically derived seeding layer for {100}-textured PZT thin films / Tyholdt, F. ; Calame, F. ; Prume, K. ; Raeder, H. ; Muralt, P.}, series = {Journal of Electroceramics. 19 (2007), H. 4}, journal = {Journal of Electroceramics. 19 (2007), H. 4}, isbn = {1385-3449}, pages = {311 -- 314}, year = {2007}, language = {en} } @article{PrumeRoelofsSchmitzetal.2002, author = {Prume, Klaus and Roelofs, Andreas and Schmitz, Thorsten and Reichenberg, Bernd}, title = {Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb}, series = {Japanese Journal of Applied Physics. 41 (2002), H. 11B}, journal = {Japanese Journal of Applied Physics. 41 (2002), H. 11B}, isbn = {0021-4922}, pages = {7198 -- 7201}, year = {2002}, language = {en} } @article{PrumeTiedkeSchmitzetal.2001, author = {Prume, Klaus and Tiedke, S. and Schmitz, T. and Roelofs, A.}, title = {Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs}, series = {Applied Physics Letters. 79 (2001), H. 22}, journal = {Applied Physics Letters. 79 (2001), H. 22}, isbn = {0003-6951}, pages = {3678 -- 3680}, year = {2001}, language = {en} } @article{PrumeMeyerWaseretal.2005, author = {Prume, Klaus and Meyer, Ren{\´e} and Waser, Rainer and Schmitz, Torsten}, title = {Dynamic leakage current compensation in ferroelectric thin-film capacitor structures / Meyer, Ren{\´e} ; Waser, Rainer ; Prume, Klaus ; Schmitz, Torsten ; Tiedke, Stephan}, series = {Applied Physics Letters . 86 (2005), H. 14}, journal = {Applied Physics Letters . 86 (2005), H. 14}, isbn = {0003-6951}, pages = {142907-1 -- 142907-3}, year = {2005}, language = {en} } @article{PrumeZalachasLaskewitzetal.2008, author = {Prume, Klaus and Zalachas, Nicolas and Laskewitz, Bernd and Kamlah, Marc}, title = {Effective Piezoelectric Coefficients of Ferroelectric Thin Films on Elastic Substrates / Zalachas, Nicolas ; Laskewitz, Bernd ; Kamlah, Marc ; Prume, Klaus ; Lapusta, Yuri ; Tiedke, Stephan}, series = {Journal of Intelligent Material Systems and Structures. 20 (2008), H. 6}, journal = {Journal of Intelligent Material Systems and Structures. 20 (2008), H. 6}, isbn = {1045-389X}, pages = {683 -- 695}, year = {2008}, language = {en} } @article{PrumeGerberRoelofsetal.2004, author = {Prume, Klaus and Gerber, P. and Roelofs, A. and K{\"u}geler, C.}, title = {Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; K{\"u}geler, C.; B{\"o}ttger, U. ; Waser, R. ; Prume, K. ;}, series = {Journal of Applied Physics . 96 (2004), H. 5}, journal = {Journal of Applied Physics . 96 (2004), H. 5}, isbn = {0021-8979}, pages = {2800 -- 2804}, year = {2004}, language = {en} } @article{Prume2007, author = {Prume, Klaus}, title = {Electrical and electromechanical characterization of piezoelectric thin films in view of MEMS application / Tiedke, S. ; Prume, K. ; Schmitz-Kempen, T.;}, pages = {702}, year = {2007}, language = {en} } @article{PrumeMuraltCalameetal.2007, author = {Prume, Klaus and Muralt, Paul and Calame, Florian and Schmitz-Kempen, Thorsten}, title = {Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals / Prume, Klaus ; Muralt, Paul ; Calame, Florian ; Schmitz-Kempen, Thorsten ; Tiedke, Stephan}, series = {Journal of Electroceramics. 19 (2007), H. 4}, journal = {Journal of Electroceramics. 19 (2007), H. 4}, isbn = {1385-3449}, pages = {407 -- 411}, year = {2007}, language = {en} } @article{PrumeFrankenMaieretal.2000, author = {Prume, Klaus and Franken, Klaus and Maier, Horst R. and Waser, Rainer}, title = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer}, series = {Journal of the American Ceramic Society. 83 (2000), H. 6}, journal = {Journal of the American Ceramic Society. 83 (2000), H. 6}, isbn = {0002-7820}, pages = {1433 -- 1440}, year = {2000}, language = {en} } @article{PrumeWaserFrankenetal.2000, author = {Prume, Klaus and Waser, Rainer and Franken, Klaus and Maier, Horst R.}, title = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;}, series = {Journal of the American Ceramic Society. 83 (2000), H. 5}, journal = {Journal of the American Ceramic Society. 83 (2000), H. 5}, isbn = {0002-7820}, pages = {1153 -- 1159}, year = {2000}, language = {en} } @article{PrumeWaser2000, author = {Prume, Klaus and Waser, Rainer}, title = {Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer}, series = {Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics. Vol. 2}, journal = {Proceedings of the 2000 12th IEEE International Symposium on Applications of Ferroelectrics. Vol. 2}, pages = {675 -- 678}, year = {2000}, language = {en} } @article{PrumeReichenbergRoelofsetal.2004, author = {Prume, Klaus and Reichenberg, B. and Roelofs, A. and Waser, R.}, title = {In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.}, series = {Journal of the European Ceramic Society. 24 (2004), H. 6}, journal = {Journal of the European Ceramic Society. 24 (2004), H. 6}, isbn = {0955-2219}, pages = {1145 -- 1147}, year = {2004}, language = {en} } @book{Prume2001, author = {Prume, Klaus}, title = {Modellierung und Simulation der elektrisch-thermisch-mechanisch gekoppelten Eigenschaften keramischer Vielschichtstrukturen}, publisher = {Shaker}, address = {Aachen}, isbn = {3-8265-8309-4}, pages = {XII, 122 S. : Ill., graph. Darst.}, year = {2001}, language = {de} } @article{PrumeFrankenBoettgeretal.2002, author = {Prume, Klaus and Franken, Klaus and B{\"o}ttger, Ulrich and Waser, Rainer}, title = {Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; B{\"o}ttger, Ulrich ; Waser, Rainer ; Maier, Horst R.}, series = {Journal of the European Ceramic Society. 22 (2002), H. 8}, journal = {Journal of the European Ceramic Society. 22 (2002), H. 8}, isbn = {0955-2219}, pages = {1285 -- 1296}, year = {2002}, language = {en} } @article{PrumeMuraltCalameetal.2007, author = {Prume, Klaus and Muralt, P. and Calame, F. and Schmitz-Kempen, T.}, title = {Piezoelectric thin films: evaluation of electrical and electromechanical characteristics for MEMS devices / Prume, K. ; Muralt, P. ; Calame, F. ; Schmitz-Kempen, T. ; Tiedke, S. ;}, series = {IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control. 54 (2007), H. 1}, journal = {IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control. 54 (2007), H. 1}, isbn = {0885-3010}, pages = {81 -- 14}, year = {2007}, language = {en} } @article{PrumeGerberKuegeleretal.2004, author = {Prume, Klaus and Gerber, Peter and K{\"u}geler, Carsten and Roelofs, Andreas}, title = {Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size / Prume, K. ; Gerber, P. ; K{\"u}geler, C. ; Roelofs, A. ; B{\"o}ttger, U. ; Waser, R. ; Schmitz-Kempen,}, isbn = {0-7803-8410-5}, pages = {7 -- 10}, year = {2004}, language = {en} } @article{PrumeRaederTyholdtetal.2007, author = {Prume, Klaus and Raeder, H. and Tyholdt, F. and Booij, W. E.}, title = {Taking piezoelectric microsystems from the laboratory to production / Raeder, H. ; Tyholdt, F. ; Booij, W. ; Calame, F. ; Ostbo, N. P. ; Bredesen, R. ; Prume, K. ; Rijnders, G. ; Muralt, P.}, series = {Journal of Electroceramics. 19 (2007), H. 4}, journal = {Journal of Electroceramics. 19 (2007), H. 4}, isbn = {1385-3449}, pages = {357 -- 362}, year = {2007}, language = {en} }