@article{HagemannHenningsWernicke1984, author = {Hagemann, Hans-J{\"u}rgen and Hennings, D. and Wernicke, R.}, title = {Ceramic multilayer capacitors. Hagemann, H. J.; Hennings, D.; Wernicke, R.}, series = {Philips' technical review / Philips' Gloeilampenfabrieken. Philips' Gloeilampenfabrieken . 41 (1984)}, journal = {Philips' technical review / Philips' Gloeilampenfabrieken. Philips' Gloeilampenfabrieken . 41 (1984)}, isbn = {0031-7926}, pages = {89 -- 98}, year = {1984}, language = {en} } @article{HagemannStumpeWagneretal.1985, author = {Hagemann, Hans-J{\"u}rgen and Stumpe, R. and Wagner, D. and B{\"a}uerle, D.}, title = {The influence of contact effects on the dielectric behavior of diffuse phase transitions. Stumpe, R.; Wagner, D.; B{\"a}uerle, D.; Hagemann, H. J.}, series = {Ferroelectrics : the international journal devoted to the theoretical, experimental, and applied aspects of ferroelectrics and related materials / Letters section. 4 (1985)}, journal = {Ferroelectrics : the international journal devoted to the theoretical, experimental, and applied aspects of ferroelectrics and related materials / Letters section. 4 (1985)}, isbn = {0731-5171}, pages = {143 -- 147}, year = {1985}, language = {en} } @article{HagemannGeittnerWarnieretal.1985, author = {Hagemann, Hans-J{\"u}rgen and Geittner, P. and Warnier, J. and Weling, F.}, title = {Reduction of geometric taper losses in the PCVD process. Geittner, P.; Hagemann, H. J.; Warnier, J.; Weling, F.; Wilson, H.}, series = {Electronics letters : an intern. publication / The Institution of Electrical Engineers. 21 (1985), H. 13}, journal = {Electronics letters : an intern. publication / The Institution of Electrical Engineers. 21 (1985), H. 13}, isbn = {0013-5194}, pages = {870 -- 871}, year = {1985}, language = {en} } @article{HagemannGeittnerLeers1989, author = {Hagemann, Hans-J{\"u}rgen and Geittner, P. and Leers, D.}, title = {Intrinsic scattering and absorption losses of Ge- and F-doped optical fibres prepared by PCVD. Geittner, P.; Hagemann, H. J. ; Leers, D.}, series = {Electronics letters : an intern. publication / The Institution of Electrical Engineers. 25 (1989), H. 7}, journal = {Electronics letters : an intern. publication / The Institution of Electrical Engineers. 25 (1989), H. 7}, isbn = {0013-5194}, pages = {436 -- 437}, year = {1989}, language = {en} } @article{HagemannGeittnerWarnieretal.1986, author = {Hagemann, Hans-J{\"u}rgen and Geittner, P. and Warnier, J. and Wilson, H.}, title = {PCVD at high deposition rates. Geittner, P.; Hagemann, H. J.; Warnier, J.; Wilson, H.}, series = {Journal of Lightwave Technology (J-LT) / Institute of Electrical and Electronics Engineers (IEEE). 4 (1986), H. 7}, journal = {Journal of Lightwave Technology (J-LT) / Institute of Electrical and Electronics Engineers (IEEE). 4 (1986), H. 7}, isbn = {0733-8724}, pages = {818 -- 822}, year = {1986}, language = {en} } @article{MuehlBinneboeselKlingeetal.2008, author = {M{\"u}hl, Thomas and Binneb{\"o}sel, Marcel and Klinge, Uwe and Goedderz, Thomas}, title = {New objective measurement to characterize the porosity of textile implants}, series = {Journal of Biomedical Materials Research Part B: Applied Biomaterials. 84B (2008), H. 1}, journal = {Journal of Biomedical Materials Research Part B: Applied Biomaterials. 84B (2008), H. 1}, isbn = {1552-4981}, pages = {176 -- 183}, year = {2008}, language = {en} } @article{PrumeFrankenMaieretal.2000, author = {Prume, Klaus and Franken, Klaus and Maier, Horst R. and Waser, Rainer}, title = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer}, series = {Journal of the American Ceramic Society. 83 (2000), H. 6}, journal = {Journal of the American Ceramic Society. 83 (2000), H. 6}, isbn = {0002-7820}, pages = {1433 -- 1440}, year = {2000}, language = {en} } @article{PrumeWaserFrankenetal.2000, author = {Prume, Klaus and Waser, Rainer and Franken, Klaus and Maier, Horst R.}, title = {Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;}, series = {Journal of the American Ceramic Society. 83 (2000), H. 5}, journal = {Journal of the American Ceramic Society. 83 (2000), H. 5}, isbn = {0002-7820}, pages = {1153 -- 1159}, year = {2000}, language = {en} } @article{PrumeReichenbergRoelofsetal.2004, author = {Prume, Klaus and Reichenberg, B. and Roelofs, A. and Waser, R.}, title = {In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.}, series = {Journal of the European Ceramic Society. 24 (2004), H. 6}, journal = {Journal of the European Ceramic Society. 24 (2004), H. 6}, isbn = {0955-2219}, pages = {1145 -- 1147}, year = {2004}, language = {en} } @article{PrumeFrankenBoettgeretal.2002, author = {Prume, Klaus and Franken, Klaus and B{\"o}ttger, Ulrich and Waser, Rainer}, title = {Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; B{\"o}ttger, Ulrich ; Waser, Rainer ; Maier, Horst R.}, series = {Journal of the European Ceramic Society. 22 (2002), H. 8}, journal = {Journal of the European Ceramic Society. 22 (2002), H. 8}, isbn = {0955-2219}, pages = {1285 -- 1296}, year = {2002}, language = {en} } @article{PrumeRoelofsSchmitzetal.2002, author = {Prume, Klaus and Roelofs, Andreas and Schmitz, Thorsten and Reichenberg, Bernd}, title = {Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb}, series = {Japanese Journal of Applied Physics. 41 (2002), H. 11B}, journal = {Japanese Journal of Applied Physics. 41 (2002), H. 11B}, isbn = {0021-4922}, pages = {7198 -- 7201}, year = {2002}, language = {en} } @article{PrumeMeyerWaseretal.2005, author = {Prume, Klaus and Meyer, Ren{\´e} and Waser, Rainer and Schmitz, Torsten}, title = {Dynamic leakage current compensation in ferroelectric thin-film capacitor structures / Meyer, Ren{\´e} ; Waser, Rainer ; Prume, Klaus ; Schmitz, Torsten ; Tiedke, Stephan}, series = {Applied Physics Letters . 86 (2005), H. 14}, journal = {Applied Physics Letters . 86 (2005), H. 14}, isbn = {0003-6951}, pages = {142907-1 -- 142907-3}, year = {2005}, language = {en} } @article{PrumeMuraltCalameetal.2007, author = {Prume, Klaus and Muralt, Paul and Calame, Florian and Schmitz-Kempen, Thorsten}, title = {Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals / Prume, Klaus ; Muralt, Paul ; Calame, Florian ; Schmitz-Kempen, Thorsten ; Tiedke, Stephan}, series = {Journal of Electroceramics. 19 (2007), H. 4}, journal = {Journal of Electroceramics. 19 (2007), H. 4}, isbn = {1385-3449}, pages = {407 -- 411}, year = {2007}, language = {en} } @article{PrumeBooijVogletal.2007, author = {Prume, Klaus and Booij, W. E. and Vogl, A. H. and Wang, D. T.}, title = {A simple and powerful analytical model for MEMS piezoelectric multimorphs / Booij, W. E. ; Vogl, A. H. ; Wang, D. T. ; Tyholdt, F. ; Ostbo, N. P. ; Raeder, H. ; Prume, K.}, series = {Journal of Electroceramics. 19 (2007), H. 4}, journal = {Journal of Electroceramics. 19 (2007), H. 4}, isbn = {1385-3449}, pages = {387 -- 393}, year = {2007}, language = {en} } @article{PrumeTyholdtCalameetal.2007, author = {Prume, Klaus and Tyholdt, F. and Calame, F. and Raeder, H.}, title = {Chemically derived seeding layer for {100}-textured PZT thin films / Tyholdt, F. ; Calame, F. ; Prume, K. ; Raeder, H. ; Muralt, P.}, series = {Journal of Electroceramics. 19 (2007), H. 4}, journal = {Journal of Electroceramics. 19 (2007), H. 4}, isbn = {1385-3449}, pages = {311 -- 314}, year = {2007}, language = {en} } @article{PrumeRaederTyholdtetal.2007, author = {Prume, Klaus and Raeder, H. and Tyholdt, F. and Booij, W. E.}, title = {Taking piezoelectric microsystems from the laboratory to production / Raeder, H. ; Tyholdt, F. ; Booij, W. ; Calame, F. ; Ostbo, N. P. ; Bredesen, R. ; Prume, K. ; Rijnders, G. ; Muralt, P.}, series = {Journal of Electroceramics. 19 (2007), H. 4}, journal = {Journal of Electroceramics. 19 (2007), H. 4}, isbn = {1385-3449}, pages = {357 -- 362}, year = {2007}, language = {en} } @article{PrumePeterRuedigeretal.2005, author = {Prume, Klaus and Peter, F. and R{\"u}diger, A. and Dittmann, R.}, title = {Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates / Peter, F. ; R{\"u}diger, A. ; Dittmann, R. ; Waser, R. ; Szot, K. ; Reichenberg, B. ; Prume, K. ;}, series = {Applied Physics Letters . 87 (2005), H. 8}, journal = {Applied Physics Letters . 87 (2005), H. 8}, isbn = {0003-6951}, pages = {082901 -- 082901-3}, year = {2005}, language = {en} } @article{PrumeGerberKuegeleretal.2004, author = {Prume, Klaus and Gerber, Peter and K{\"u}geler, Carsten and Roelofs, Andreas}, title = {Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size / Prume, K. ; Gerber, P. ; K{\"u}geler, C. ; Roelofs, A. ; B{\"o}ttger, U. ; Waser, R. ; Schmitz-Kempen,}, isbn = {0-7803-8410-5}, pages = {7 -- 10}, year = {2004}, language = {en} } @article{PrumeTiedkeSchmitzetal.2001, author = {Prume, Klaus and Tiedke, S. and Schmitz, T. and Roelofs, A.}, title = {Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs}, series = {Applied Physics Letters. 79 (2001), H. 22}, journal = {Applied Physics Letters. 79 (2001), H. 22}, isbn = {0003-6951}, pages = {3678 -- 3680}, year = {2001}, language = {en} } @article{PrumeGerberRoelofsetal.2004, author = {Prume, Klaus and Gerber, P. and Roelofs, A. and K{\"u}geler, C.}, title = {Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; K{\"u}geler, C.; B{\"o}ttger, U. ; Waser, R. ; Prume, K. ;}, series = {Journal of Applied Physics . 96 (2004), H. 5}, journal = {Journal of Applied Physics . 96 (2004), H. 5}, isbn = {0021-8979}, pages = {2800 -- 2804}, year = {2004}, language = {en} }