@article{Heuermann1999,
  author    = {Heuermann, Holger},
  title     = {Calibration procedures with series impedances and unknown lines simplify on-wafer measurements},
  series = {IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 47 (1999), H. 1},
  journal   = {IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 47 (1999), H. 1},
  isbn      = {0018-9480},
  pages     = {1 -- 5},
  year      = {1999},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Calibration of network analyser measurements with leakage errors},
  series = {Electronics letters. 30 (1994), H. 1},
  journal   = {Electronics letters. 30 (1994), H. 1},
  isbn      = {0013-5194},
  pages     = {52 -- 53},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1992,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {LNN (Line-Network-Network): Verfahren zur Kalibrierung von Netzwerkanalysatoren},
  series = {Kleinheubacher Berichte : Vortr{\"a}ge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 36. 1992 (1992)},
  journal   = {Kleinheubacher Berichte : Vortr{\"a}ge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 36. 1992 (1992)},
  pages     = {327 -- 335},
  year      = {1992},
  language  = {en}
}
@article{HeuermannSchiek1993,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {LNN( Line-Network-Network): The In-Fixture Calibration Procedure},
  pages     = {149 -- 149},
  year      = {1993},
  language  = {en}
}
@article{HeuermannSchiek1992,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {A Fast and Robust Procedure for the Determination of the Scattering Parameters for Network Analyzer Calibration},
  address   = {Paris},
  pages     = {373 -- 374},
  year      = {1992},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Error Corrected Impedance Measurements with a Network Analyzer},
  pages     = {125 -- 126},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1992,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {A Generalization of the Txx Network Analyzer Self-Calibration Procedure},
  series = {Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2},
  journal   = {Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2},
  publisher = {Microwave Exhibitions and Publishers},
  address   = {Tunbridge Wells},
  isbn      = {0-946821-77-1},
  pages     = {907 -- 912},
  year      = {1992},
  language  = {en}
}
@article{HeuermannSchiek1992,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {The In-Fixture Calibration Procedure Line-Network-Network-LNN},
  series = {Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community]},
  journal   = {Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community]},
  publisher = {Reed Exhibition Companies},
  address   = {Tunbridge Wells},
  isbn      = {0-946821-23-2},
  pages     = {500 -- 505},
  year      = {1992},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique},
  series = {Conference proceedings : [Palais des Festivals et des Congr{\`e}s Cannes, France, 5 - 8 September 1994]},
  journal   = {Conference proceedings : [Palais des Festivals et des Congr{\`e}s Cannes, France, 5 - 8 September 1994]},
  publisher = {Nexus Business Communications},
  address   = {Swanley},
  isbn      = {0-9518032-5-5},
  year      = {1994},
  language  = {en}
}
@article{HeuermannSchiek1995,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {The double-LNN Calibration technique for scattering parameter measurements of microstrip devices},
  series = {Conference proceedings},
  journal   = {Conference proceedings},
  publisher = {NEXUS House},
  address   = {Kent},
  pages     = {343 -- 347},
  year      = {1995},
  language  = {en}
}
@article{Heuermann1995,
  author    = {Heuermann, Holger},
  title     = {LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements},
  pages     = {129 -- 136},
  year      = {1995},
  language  = {en}
}
@article{Heuermann1996,
  author    = {Heuermann, Holger},
  title     = {Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures},
  pages     = {136 -- 145},
  year      = {1996},
  language  = {en}
}
@article{Heuermann1997,
  author    = {Heuermann, Holger},
  title     = {Microwave On-Wafer Measurements with Activ Needle Probe Tips},
  pages     = {208 -- 214},
  year      = {1997},
  language  = {en}
}
@article{HeuermannSchiek1994,
  author    = {Heuermann, Holger and Schiek, Burkhard},
  title     = {Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure},
  pages     = {1361 -- 1364},
  year      = {1994},
  language  = {en}
}
@article{HeuermannBaumannFauthetal.1994,
  author    = {Heuermann, Holger and Baumann, F.-M. and Fauth, G. and Albert, M.},
  title     = {Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure},
  series = {On-Line Moisture Analysis of Raw Coal},
  journal   = {On-Line Moisture Analysis of Raw Coal},
  pages     = {1361 -- 1364},
  year      = {1994},
  language  = {en}
}
@article{Fabo2002,
  author    = {Fabo, Sabine},
  title     = {Welcome to the training: Actionist Respoke interaktiv by Michael Jonoschek und R{\"u}diger Schl{\"o}mer},
  series = {Bilder-Codes : Internationaler Medienkunstpreis 2002},
  journal   = {Bilder-Codes : Internationaler Medienkunstpreis 2002},
  editor    = {K{\"o}nches, Barbara},
  publisher = {ZKM},
  address   = {Karlsruhe},
  isbn      = {3-928201-28-X},
  pages     = {41 -- 48},
  year      = {2002},
  language  = {en}
}
@article{Wrede1996,
  author    = {Wrede, Oliver},
  title     = {Mnemotechnik in graphischen Benutzeroberfl{\"a}chen},
  series = {Form <Basel> / Form-Diskurs : Zeitschrift f{\"u}r Design und Theorie. 1 (1996), H. 2},
  journal   = {Form <Basel> / Form-Diskurs : Zeitschrift f{\"u}r Design und Theorie. 1 (1996), H. 2},
  year      = {1996},
  language  = {en}
}
@article{KaemperKurzawaSchmittetal.1986,
  author    = {K{\"a}mper, Klaus-Peter and Kurzawa, R. and Schmitt, W. and G{\"u}ntherodt, G.},
  title     = {Spin-resolved photoemission study of in situ grown epitaxial Fe layers on W(110). Kurzawa, R.; K{\"a}mper, K.-P.; Schmitt, W.; G{\"u}ntherodt, G.},
  series = {Solid State Communications. 60 (1986), H. 10},
  journal   = {Solid State Communications. 60 (1986), H. 10},
  isbn      = {0038-1098},
  pages     = {777 -- 780},
  year      = {1986},
  language  = {en}
}
@article{KrauseGoettlichMoelleretal.1989,
  author    = {Krause, Gregor and G{\"o}ttlich, S. and M{\"o}ller, K. and Meurer, D.},
  title     = {Space Charge Phenomena in Partially Crystalline Polymers: On-Line Measurement of Charge Carrier Motion under High AC-Field Strength / G. Krause, S. G{\"o}ttlich, K. M{\"o}ller, D. Meurer},
  series = {Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics : Trondheim, Norway ... 1989},
  journal   = {Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics : Trondheim, Norway ... 1989},
  publisher = {IEEE},
  address   = {Piscataway, N.J.},
  pages     = {IX, 607 S.},
  year      = {1989},
  language  = {en}
}
@article{KrauseNeubertPietsch1990,
  author    = {Krause, Gregor and Neubert, R. and Pietsch, R.},
  title     = {Investigations of Electrical Aging in Polymers under High AC-Field Strength},
  series = {1990 annual report : October 28 - October 31, 1990 / sponsored by the IEEE Dielectrics and Electrical Insulation Society},
  journal   = {1990 annual report : October 28 - October 31, 1990 / sponsored by the IEEE Dielectrics and Electrical Insulation Society},
  publisher = {IEEE Service Center},
  address   = {Piscataway, N.J},
  pages     = {716 S : Ill., graph. Darst.},
  year      = {1990},
  language  = {en}
}