TY  - JOUR
A1  - Schöning, Michael Josef
A1  - Schmidt, C.
A1  - Schubert, J.
A1  - Zander, W.
A1  - Mesters, S.
A1  - Kordos, P.
A1  - Lüth, H.
A1  - Legin, A.
A1  - Seleznev, B.
A1  - Vlasov, Y. G.
T1  - Thin film sensors on the basis of chalcogenide glass materials prepared by pulsed laser deposition technique
JF  - Sensors and Actuators B. 68 (2000), H. 1-3
Y1  - 2000
SN  - 0925-4005
SP  - 254
EP  - 259
ER  - 
TY  - JOUR
A1  - Schöning, Michael Josef
A1  - Glück, O.
A1  - Kordos, P.
A1  - Lüth, H.
A1  - Emons, H.
T1  - Thin film electrodes for trace metal analysis by dc resistance changes
JF  - Proceedings of SPIE. 3857 (1999)
Y1  - 1999
SP  - 135
EP  - 143
ER  - 
TY  - JOUR
A1  - Schöning, Michael Josef
A1  - Thust, M.
A1  - Kordos, P.
A1  - Lüth, H.
T1  - Chemical sensing structures - From EIS capacitors to array-type sensors
JF  - Solid state chemical and biochemical sensors : proceedings of Topical Symposium 9 - "Solid State Chemical and Biochemical Sensors" of the Forum on New Materials of the 9th CIMTEC-World Ceramics Congress and Forum on New Materials Florence, Italy June 14-1
Y1  - 1999
SN  - 88-86538-27-8
N1  - Serie Advances in science and technology ; 26
SP  - 55
EP  - 62
PB  - Techna
CY  - Faenza
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Darmo, J.
A1  - Dubecký, F.
A1  - Kordos, P.
T1  - Annealing characteristics of native defects in low-temperature-grown MBE GaAs / J. Darmo ; F. Dubecky ; P. Kordos ; A. Förster
JF  - Semiconducting and insulating materials 1996 : proceedings of the 9th Conference on Semiconducting and Insulating Materials (SIMC '9), April 29 - May 3, 1996, Toulouse, France / [IEEE]
Y1  - 1996
SN  - 0-7803-3095-1
N1  - 2. ISBN: 0-7803-3179-6 ; Conference on Semiconducting and Insulating Materials <9, 1996, Toulouse> ; Institute of Electrical and Electronics Engineers ; IEEE Cat. No.96CH35881
SP  - 67
EP  - ff.
CY  - Piscataway, NJ [u.a.]
ER  -