TY  - JOUR
A1  - Makovicka, C.
A1  - Gärtner, G.
A1  - Hardt, Arno
A1  - Hermann, W.
A1  - Wiechert, D. U.
T1  - Impregnated cathode surface investigations by SFM/STM and SEM/EDX
JF  - Applied surface science. Vol. 111
Y1  - 1997
SN  - 1873-5584 (E-Journal); 0169-4332 (Print)
SP  - 70
EP  - 75
ER  - 
TY  - JOUR
A1  - Balewski, J.
A1  - Brauksiepe, S.
A1  - Hardt, Arno
T1  - Threshold measurements at the internal experimental facility COSY-11 / J. Balewski [u.a.]
JF  - Nuclear physics A. Vol. 626, iss. 1-2
Y1  - 1997
SN  - 1873-1554 (E-Journal) ; 0375-9474 (Print)
SP  - 85
EP  - 92
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Kordos, P.
A1  - Ruders, F.
T1  - Properties of LT MBE GaAs for photomixing up to THz frequencies / P. Kordos ; F. Ruders ; M. Marso ; A. Förster
JF  - Proceedings : 8 - 11 December 1996, Australian National University, Canberra, Australia / ed.: C. Jagadish
Y1  - 1997
SN  - 0-7803-3374-8
N1  - Conference on Optoelectronic and Microelectronic Materials and Devices <1996, Canberra> ; IEEE catalog number: 96TH8197
SP  - 71
EP  - ff.
PB  - IEEE Service Center
CY  - Piscataway, NJ
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Rosenauer, A.
A1  - Remmele, T.
T1  - Strain determination in mismatched semiconductor heterostructures by the digital analysis of lattice images / A. Rosenauer ; T. Remmele ; U. Fischer ; A. Förster ...
JF  - Microscopy of semiconducting materials 1997 : proceedings of the Royal Microscopical Society Conference held at Oxford University, 7 - 10 April 1997 / ed. by A. G. Cullis ... - (Conference series / Institute of Physics ; 157)
Y1  - 1997
SN  - 0-7503-0464-2
N1  - MSM <10, 1997, Oxford> ; Conference on Microscopy of Semiconducting Materials <10, 1997, Oxford> ; Institut of Physics <London>
SP  - 39
EP  - ff.
PB  - Institute of Physics
CY  - Bristol [u.a.]
ER  - 
TY  - JOUR
A1  - Ungermanns, C.
A1  - Ahe, M. v. d.
A1  - Carius, Reinhard
A1  - Förster, Arnold
T1  - Optimization of III/V binary growth with RHEED in MOMBE / C. Ungermanns ; M. v. d. Ahe ; R. Carius ; A. Förster ...
JF  - Fresenius' Journal of Analytical Chemistry. 358 (1997), H. 1-2
Y1  - 1997
SN  - 0937-0633
N1  - ISSN der E-Ausg.: 1432-1130
SP  - 101
EP  - 104
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Bertuccio, G.
A1  - Pullia, A.
T1  - Pixel X-ray detectors in epitaxial gallium arsenide withhigh-energy resolution capabilities (Fano factor experimentaldetermination) /  G. Bertuccio ; A. Pullia ; J. Lauter ; A. Förster ...
JF  - IEEE transactions on nuclear science. 44 (1997), H. 1
Y1  - 1997
SN  - 0018-9499
SP  - 1
EP  - 5
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Schmidt, T.
A1  - Haug, R. J.
T1  - Observation of the local structure of landau bands in a disordered conductor / T. Schmidt ; R. J. Haug ; Vladimir I. Fal'ko ... A. Förster ...
JF  - Physical review letters. 78 (1997), H. 8
Y1  - 1997
SN  - 0031-9007
N1  - ISSN der E-Ausg.: 1079-7114
SP  - 1540
EP  - 1543
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Rosenauer, A.
A1  - Remmele, T.
T1  - Atomic scale strain measurements by the digital analysis of transmission electron microscopic lattice images / A. Rosenauer ; T. Remmele ; D. Gerthsen ... A. Förster
JF  - Optik : international journal for light and electron optics. 105 (1997), H. 3
Y1  - 1997
SN  - 0030-4026
SP  - 99
EP  - 107
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Lachenmann, S. G.
A1  - Kastalsky, A.
T1  - Properties of Nb/InAs/Nb hybrid step junctions / S. G. Lachenmann ; A. Kastalsky ; I. Friedrich ; A. Förster ...
JF  - Journal of low temperature physics. 106 (1997), H. 3-4
Y1  - 1997
SN  - 0022-2291
N1  - ISSN der E-Ausg.: 1573-7357
SP  - 321
EP  - 326
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Schmidt, T.
A1  - Haug, R. J.
T1  - Spectroscopy of the single-particle states of a quantum-dot molecule / T. Schmidt ; R. J. Haug ; K. v. Klitzing ; A. Förster ...
JF  - Physical review letters. 78 (1997), H. 8
Y1  - 1997
SN  - 0031-9007
N1  - ISSN der E-Ausg.: 1079-7114
SP  - 1544
EP  - 1547
ER  -