TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - A Generalization of the Txx Network Analyzer Self-Calibration Procedure
JF  - Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2
Y1  - 1992
SN  - 0-946821-77-1
N1  - European Microwave Conference <22, 1992, Espoo> ; Teknillinen Korkeakoulu <Helsinki>
SP  - 907
EP  - 912
PB  - Microwave Exhibitions and Publishers
CY  - Tunbridge Wells
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Procedures for the Determination of the Scattering Parameters for Network Analyzer Calibration
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2
Y1  - 1993
SN  - 0018-9456
SP  - 528
EP  - 531
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1
Y1  - 1994
SN  - 0018-9456
SP  - 18
EP  - 23
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1120
EP  - 1127
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Error corrected impedance measurements with a network analyzer
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2
Y1  - 1995
SN  - 0018-9456
SP  - 295
EP  - 299
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - 15-term self-calibration methods for the error-correction of on-wafer measurements
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1105
EP  - 1110
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Sadeghfam, Arash
A1  - Boehm, H.
T1  - Ultra Compact Multi-Mode Filter with Novel Rat-Race Inductor. Sadeghfam, Arash; Heuermann, Holger; Boehm, H.
JF  - Conference proceedings : 3 - 7 October 2005, CNIT la Défense, Paris, France; [comprises the] 35th European Microwave Conference 2005 ; The European Conference on Wireless Technology 2005 ; European Radar Conference 2005 ; GAAS 2005, The European Gallium A. Vol. 2
Y1  - 2005
SN  - 2-9600551-0-1
N1  - European Microwave Conference ; (35, 2005, Paris) ; European Microwave Week ; (2005, Paris)
SP  - 4 pp.
PB  - Horizon House Publ
CY  - London
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Sadeghfam, Arash
T1  - Electrically tunable bandpass filter with integrated carrier suppression for UHF RFID systems / Sadeghfam, Arash ; Heuermann, Holger
JF  - European Microwave Conference, 2008, EuMC 2008, 38th
Y1  - 2008
SN  - 978-2-87487-006-4
SP  - 1727
EP  - 1730
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Sadeghfam, Arash
T1  - On the design of multimode integrated circuits in multilayered processes / Sadeghfam, A. ; Heuermann, H.
JF  - European Microwave Conference, 2007, 9-12 Oct. 2007
Y1  - 2007
SN  - 978-2-87487-001-9
N1  - EuMC 2007 ; European Microwave Conference ; (37 : ; 2007.10.09-12 : ; Munich)
SP  - 516
EP  - 519
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Sadeghfam, Arash
T1  - Electrically tunable bandpass filter with integrated carrier suppression for UHF RFID systems / Sadeghfam, Arash ; Heuermann, Holger
JF  - European Conference on Wireless Technology, 2008. EuWiT 2008.
Y1  - 2008
SN  - 978-2-87487-008-8
SP  - 306
EP  - 309
ER  -