TY  - CHAP
A1  - Stender, Michael
A1  - Ritz, Thomas
T1  - Modeling of business-to-business mobile commerce processes
T2  - Electronic proceedings / ICPR 17, 17th International Conference on Production Research [Blacksburg, Virginia, USA, August 3 - 7, 2003]
Y1  - 2003
SN  - 0-9721257-3-6
CY  - Blacksburg, Va.
ET  - CD-ROM-Ausg.
ER  - 
TY  - CHAP
A1  - Ritz, Thomas
T1  - Production and distribution of personalized information services employing mass customization
T2  - 2nd Interdisciplinary World Congress on Mass Customization and Personalization : MCPC'03, October 6 - 8, 2003, Technische Universität München, Munic, Germany
Y1  - 2003
SP  - Part IV
PB  - Techn. Univ. (TUM)
CY  - München
ET  - CD-Ausg.
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Stolle, Reinhard
A1  - Schiek, Burkhard
T1  - Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B.
Y1  - 1995
N1  - Conference proceedings / IEEE NTC '95, the Microwave Systems Conference;  NTC <1995, Orlando, Fla.>
SP  - 129
EP  - 132
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Baumann, F.-M.
A1  - Fauth, G.
A1  - Albert, M.
T1  - Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure
JF  - On-Line Moisture Analysis of Raw Coal
Y1  - 1994
N1  - 1993 International Symposium on On-Line Analysis of Coal : Vienna ; [proceedings].
SP  - 1361
EP  - 1364
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure
Y1  - 1994
N1  - 1994 IEEE MTT-S International Microwave Symposium digest : May 23 - 27, 1994, San Diego Convention Center, San Diego, California / H. J. Kuno, ed.
SP  - 1361
EP  - 1364
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - The double-LNN Calibration technique for scattering parameter measurements of microstrip devices
JF  - Conference proceedings
Y1  - 1995
N1  - European Microwave Conference <25, 1995, Bologna>
SP  - 343
EP  - 347
PB  - NEXUS House
CY  - Kent
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures
Y1  - 1996
N1  - 46th ARFTG conference digest : November 30 - December 1. 1995, Safari Resort, Scottsdale, Arizona / Automatic RF Techniques Group. [Publ. chairman: Ed. Godshalk]
SP  - 136
EP  - 145
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Microwave On-Wafer Measurements with Activ Needle Probe Tips
Y1  - 1997
N1  - 47th ARFTG Conference digest : June 20 - 21, 1996, Moscone Convention Center, San Francisco, California / Automatic RF Techniques Group. [Publication chair: Ed Godshalk
SP  - 208
EP  - 214
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements
Y1  - 1995
N1  - 45th ARFTG Conference digest, Spring 1995 : [conference topic: Testing and design of RFIC'S], May 19, 1995, Orange County Convention Center, Orlando, Florida / Automatic RF Techniques Group. Publications chairman: Ed Godshalk;  ARFTG Conference digest ; 4
SP  - 129
EP  - 136
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique
JF  - Conference proceedings : [Palais des Festivals et des Congrès Cannes, France, 5 - 8 September 1994]
Y1  - 1994
SN  - 0-9518032-5-5
N1  - European Microwave Conference <24, 1994, Cannes>
PB  - Nexus Business Communications
CY  - Swanley
ER  -