TY  - JOUR
A1  - Prume, Klaus
A1  - Zalachas, Nicolas
A1  - Laskewitz, Bernd
A1  - Kamlah, Marc
T1  - Effective Piezoelectric Coefficients of Ferroelectric Thin Films on Elastic Substrates / Zalachas, Nicolas ; Laskewitz, Bernd ; Kamlah, Marc ; Prume, Klaus ; Lapusta, Yuri ; Tiedke, Stephan
JF  - Journal of Intelligent Material Systems and Structures. 20 (2008), H. 6
Y1  - 2008
SN  - 1045-389X
SP  - 683
EP  - 695
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Waser, Rainer
A1  - Franken, Klaus
A1  - Maier, Horst R.
T1  - Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;
JF  - Journal of the American Ceramic Society. 83 (2000), H. 5
Y1  - 2000
SN  - 0002-7820
SP  - 1153
EP  - 1159
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Waser, Rainer
T1  - Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer
JF  - Proceedings of the 2000 12th IEEE International Symposium on  Applications of Ferroelectrics. Vol. 2
Y1  - 2000
N1  - ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on  Applications of Ferroelectrics
SP  - 675
EP  - 678
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Tyholdt, F.
A1  - Calame, F.
A1  - Raeder, H.
T1  - Chemically derived seeding layer for {100}-textured PZT thin films   / Tyholdt, F. ; Calame, F. ; Prume, K. ; Raeder, H. ; Muralt, P.
JF  - Journal of Electroceramics. 19 (2007), H. 4
Y1  - 2007
SN  - 1385-3449
SP  - 311
EP  - 314
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Tiedke, S.
A1  - Schmitz, T.
A1  - Roelofs, A.
T1  - Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs
JF  - Applied Physics Letters. 79 (2001), H. 22
Y1  - 2001
SN  - 0003-6951
SP  - 3678
EP  - 3680
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Roelofs, Andreas
A1  - Schmitz, Thorsten
A1  - Reichenberg, Bernd
T1  - Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb
JF  - Japanese Journal of Applied Physics. 41 (2002), H. 11B
Y1  - 2002
SN  - 0021-4922
SP  - 7198
EP  - 7201
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Reichenberg, B.
A1  - Roelofs, A.
A1  - Waser, R.
T1  - In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements  / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.
JF  - Journal of the European Ceramic Society. 24 (2004), H. 6
Y1  - 2004
SN  - 0955-2219
N1  - Electroceramics VIII
SP  - 1145
EP  - 1147
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Raeder, H.
A1  - Tyholdt, F.
A1  - Booij, W. E.
T1  - Taking piezoelectric microsystems from the laboratory to production  / Raeder, H. ; Tyholdt, F. ; Booij, W. ; Calame, F. ; Ostbo, N. P. ; Bredesen, R. ; Prume, K. ; Rijnders, G. ; Muralt, P.
JF  - Journal of Electroceramics. 19 (2007), H. 4
Y1  - 2007
SN  - 1385-3449
SP  - 357
EP  - 362
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Peter, F.
A1  - Rüdiger, A.
A1  - Dittmann, R.
T1  - Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates / Peter, F. ; Rüdiger, A. ; Dittmann, R. ; Waser, R. ; Szot, K. ; Reichenberg, B. ; Prume, K. ;
JF  - Applied Physics Letters  . 87 (2005), H. 8
Y1  - 2005
SN  - 0003-6951
SP  - 082901
EP  - 082901-3
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Muralt, Paul
A1  - Calame, Florian
A1  - Schmitz-Kempen, Thorsten
T1  - Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals / Prume, Klaus ; Muralt, Paul ; Calame, Florian ; Schmitz-Kempen, Thorsten ; Tiedke, Stephan
JF  - Journal of Electroceramics. 19 (2007), H. 4
Y1  - 2007
SN  - 1385-3449
SP  - 407
EP  - 411
ER  -