TY - JOUR A1 - Heuermann, Holger T1 - Praezise Streuparametermessungen sind der Schluessel zur Modellierung elektrischer Schaltungen JF - Neues von Rohde & Schwarz (1997) Y1 - 1997 SP - 22 EP - 23 ER - TY - JOUR A1 - Wolf, Martin R. A1 - Schlick, Christopher A1 - Springer, J. ED - Miyamoto, Hiroyuki T1 - The use of implicit communication mechanisms in desktop-teleconferencing-systems JF - Proceedings of WWDU '97 Tokyo, Fifth International Scientific Conference on Work with Display Units : November 3 - 5, 1997, Tokyo Y1 - 1997 N1 - International Scientific Conference on Work with Display Units ; International Scientific Conference on Work with Display Units ; (5 ; 1997.11.03-05 ; Tokyo) SP - 193 EP - 194 PB - - CY - Tokyo ER - TY - CHAP A1 - Elsen, Ingo A1 - Kraiss, Karl-Friedrich A1 - Krumbiegel, Dirk T1 - Pixel based 3D object recognition with bidirectional associative memories T2 - International Conference on Neural Networks 1997 N2 - This paper addresses the pixel based recognition of 3D objects with bidirectional associative memories. Computational power and memory requirements for this approach are identified and compared to the performance of current computer architectures by benchmarking different processors. It is shown, that the performance of special purpose hardware, like neurocomputers, is between one and two orders of magnitude higher than the performance of mainstream hardware. On the other hand, the calculation of small neural networks is performed more efficiently on mainstream processors. Based on these results a novel concept is developed, which is tailored for the efficient calculation of bidirectional associative memories. The computational efficiency is further enhanced by the application of algorithms and storage techniques which are matched to characteristics of the application at hand. Y1 - 1997 SN - 0-7803-4122-8 N1 - June 9 - 12, 1997, Westin Galleria Hotel Houston, Texas, USA. SP - 1679 EP - 1684 PB - IEEE CY - New York ER - TY - JOUR A1 - Wolf, Martin R. A1 - Armbruster, S. A1 - Schlick, Christopher A1 - Simon, S. T1 - Marktübersicht Telekooperationssysteme / Wolf, M.; Armbruster, S.; Schlick, C.; Simon, S. JF - Elsa Insight (1997) Y1 - 1997 SP - 8 EP - 9 PB - - ER - TY - JOUR A1 - Heuermann, Holger T1 - Leerläufe als postulierte Kalibrierstandards fuer Messungen auf planaren Schaltungen JF - tm - Technisches Messen. 64. 1997 (1997), H. 6 Y1 - 1997 SP - 230 EP - 237 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Line Network Network (LNN): an alternative in-fixture calibration procedure JF - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3 Y1 - 1997 SN - 0018-9480 SP - 408 EP - 413 ER - TY - JOUR A1 - Heuermann, Holger A1 - Graf, W. T1 - Direkte Messung der Dispersion des Wellenwiderstandes einer Mikrostreifenleitung JF - Kleinheubacher Berichte : Vorträge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 40. 1997 (1997) Y1 - 1997 ER - TY - JOUR A1 - Wolf, Martin R. A1 - Simon, S. A1 - Schlick, Christopher T1 - Computergestützte Kooperation - Eine Seifenblase? / Wolf, M.; Simon, S.; Schlick, C. JF - Rechnergestützte Kooperation in Verwaltungen und großen Unternehmen : Tagungsband zum Workshop der GI-Gachgruppe / Peter Mambrey ... ( Hrsg.) Y1 - 1997 SP - 220 EP - 234 PB - Univ., Fachbereich Mathematik u. Informatik CY - Essen ER - TY - JOUR A1 - Wolf, Martin R. A1 - Armbruster, S. A1 - Schlick, Christopher A1 - Simon, S. T1 - Marktübersicht Telekooperationssysteme - Das IAW stellt im Internet umfangreiche Informationen über Telekooperationssysteme zur Verfügung / Wolf, M. ; Armbruster, S. ; Schlick, C. ; Simon, S. JF - FIR + IAW Mitteilungen. 29 (1997), H. 1 Y1 - 1997 SP - 11 EP - 12 PB - - ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1120 EP - 1127 ER -