TY  - JOUR
A1  - Prume, Klaus
A1  - Raeder, H.
A1  - Tyholdt, F.
A1  - Booij, W. E.
T1  - Taking piezoelectric microsystems from the laboratory to production  / Raeder, H. ; Tyholdt, F. ; Booij, W. ; Calame, F. ; Ostbo, N. P. ; Bredesen, R. ; Prume, K. ; Rijnders, G. ; Muralt, P.
JF  - Journal of Electroceramics. 19 (2007), H. 4
Y1  - 2007
SN  - 1385-3449
SP  - 357
EP  - 362
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Zalachas, Nicolas
A1  - Laskewitz, Bernd
A1  - Kamlah, Marc
T1  - Effective Piezoelectric Coefficients of Ferroelectric Thin Films on Elastic Substrates / Zalachas, Nicolas ; Laskewitz, Bernd ; Kamlah, Marc ; Prume, Klaus ; Lapusta, Yuri ; Tiedke, Stephan
JF  - Journal of Intelligent Material Systems and Structures. 20 (2008), H. 6
Y1  - 2008
SN  - 1045-389X
SP  - 683
EP  - 695
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Muralt, Paul
A1  - Calame, Florian
A1  - Schmitz-Kempen, Thorsten
T1  - Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals / Prume, Klaus ; Muralt, Paul ; Calame, Florian ; Schmitz-Kempen, Thorsten ; Tiedke, Stephan
JF  - Journal of Electroceramics. 19 (2007), H. 4
Y1  - 2007
SN  - 1385-3449
SP  - 407
EP  - 411
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Booij, W. E.
A1  - Vogl, A. H.
A1  - Wang, D. T.
T1  - A simple and powerful analytical model for MEMS piezoelectric multimorphs  / Booij, W. E. ; Vogl, A. H. ; Wang, D. T. ; Tyholdt, F. ; Ostbo, N. P. ; Raeder, H. ; Prume, K.
JF  - Journal of Electroceramics. 19 (2007), H. 4
Y1  - 2007
SN  - 1385-3449
SP  - 387
EP  - 393
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Tyholdt, F.
A1  - Calame, F.
A1  - Raeder, H.
T1  - Chemically derived seeding layer for {100}-textured PZT thin films   / Tyholdt, F. ; Calame, F. ; Prume, K. ; Raeder, H. ; Muralt, P.
JF  - Journal of Electroceramics. 19 (2007), H. 4
Y1  - 2007
SN  - 1385-3449
SP  - 311
EP  - 314
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Franken, Klaus
A1  - Böttger, Ulrich
A1  - Waser, Rainer
T1  - Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; Böttger, Ulrich ; Waser, Rainer ; Maier, Horst R.
JF  - Journal of the European Ceramic Society. 22 (2002), H. 8
Y1  - 2002
SN  - 0955-2219
SP  - 1285
EP  - 1296
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Roelofs, Andreas
A1  - Schmitz, Thorsten
A1  - Reichenberg, Bernd
T1  - Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb
JF  - Japanese Journal of Applied Physics. 41 (2002), H. 11B
Y1  - 2002
SN  - 0021-4922
SP  - 7198
EP  - 7201
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Meyer, René
A1  - Waser, Rainer
A1  - Schmitz, Torsten
T1  - Dynamic leakage current compensation in ferroelectric thin-film capacitor structures / Meyer, René ; Waser, Rainer ; Prume, Klaus ; Schmitz, Torsten ; Tiedke, Stephan
JF  - Applied Physics Letters . 86 (2005), H. 14
Y1  - 2005
SN  - 0003-6951
SP  - 142907-1
EP  - 142907-3
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Franken, Klaus
A1  - Maier, Horst R.
A1  - Waser, Rainer
T1  - Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer
JF  - Journal of the American Ceramic Society. 83 (2000), H. 6
Y1  - 2000
SN  - 0002-7820
SP  - 1433
EP  - 1440
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Waser, Rainer
A1  - Franken, Klaus
A1  - Maier, Horst R.
T1  - Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;
JF  - Journal of the American Ceramic Society. 83 (2000), H. 5
Y1  - 2000
SN  - 0002-7820
SP  - 1153
EP  - 1159
ER  -