TY  - JOUR
A1  - Heuermann, Holger
A1  - Rumiantsev, A.
A1  - Schott, S.
T1  - Advanced on-wafer multiport calibration methods for mono- and mixed-mode device characterization
JF  - On wafer characterization : 63rd ARFTG conference digest, spring 2004, 11 June 2004, Fort Worth, TX / Automatic RF Techniques Group. [Conference chair: John Cable. Publication chair: J. G. Burns]
Y1  - 2004
SN  - 0-7803-8371-0
N1  - Microwave Theory and Techniques Society. ; Automatic RF Techniques Group ; ARFTG conference ; (63 : ; 2004.06.11 : ; Fort Worth, Tex.)
SP  - 91
EP  - 96
PB  - IEEE Operations Center
CY  - Piscataway, NJ
ER  -