TY  - JOUR
A1  - Heuermann, Holger
T1  - Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures
Y1  - 1996
N1  - 46th ARFTG conference digest : November 30 - December 1. 1995, Safari Resort, Scottsdale, Arizona / Automatic RF Techniques Group. [Publ. chairman: Ed. Godshalk]
SP  - 136
EP  - 145
ER  -