TY - JOUR A1 - Heel, Mareike van A1 - Dikta, Gerhard A1 - Braekers, Roel T1 - Bootstrap based goodness‑of‑fit tests for binary multivariate regression models JF - Journal of the Korean Statistical Society N2 - We consider a binary multivariate regression model where the conditional expectation of a binary variable given a higher-dimensional input variable belongs to a parametric family. Based on this, we introduce a model-based bootstrap (MBB) for higher-dimensional input variables. This test can be used to check whether a sequence of independent and identically distributed observations belongs to such a parametric family. The approach is based on the empirical residual process introduced by Stute (Ann Statist 25:613–641, 1997). In contrast to Stute and Zhu’s approach (2002) Stute & Zhu (Scandinavian J Statist 29:535–545, 2002), a transformation is not required. Thus, any problems associated with non-parametric regression estimation are avoided. As a result, the MBB method is much easier for users to implement. To illustrate the power of the MBB based tests, a small simulation study is performed. Compared to the approach of Stute & Zhu (Scandinavian J Statist 29:535–545, 2002), the simulations indicate a slightly improved power of the MBB based method. Finally, both methods are applied to a real data set. Y1 - 2021 U6 - http://dx.doi.org/10.1007/s42952-021-00142-4 SN - 2005-2863 (Online) SN - 1226-3192 (Print) N1 - Corresponding author: Mareike van Heel VL - 51 PB - Springer Nature CY - Singapur ER - TY - JOUR A1 - Kern, Alexander A1 - Dikta, Gerhard T1 - Bewerten von Schäden durch Blitzeinwirkungen JF - Elektropraktiker. 62 (2008), H. 4 Y1 - 2008 SN - 0013-5569 SP - 338 EP - 342 ER - TY - JOUR A1 - Kern, Alexander A1 - Dikta, Gerhard A1 - Krichel, Frank T1 - Zur Wahrscheinlichkeit für Schäden an elektrischen und elektronischen Einrichtungen durch indirekte Blitzeinschläge - Auswertung von Schadensstatistiken, analytischen und numerischen Berechnungen JF - 7. VDE-ABB-Blitzschutztagung : Vorträge der VDE-ABB-Fachtagung vom 15. bis 16. November 2007 in Neu-Ulm / Veranst.: Ausschuss für Blitzschutz und Blitzforschung (ABB) im VDE, Verband der Elektrotechnik, Elektronik, Informationstechnik e.V. Wiss. Tagungsltg.: K. Stimper Y1 - 2007 SN - 978-3-8007-3062-9 N1 - VDE-Fachbericht ; 64 ; Blitzschutztagung <7, 2007, Neu-Ulm> SP - 1 EP - 9 PB - VDE-Verl. CY - Berlin ER - TY - CHAP A1 - Kern, Alexander A1 - Dikta, Gerhard T1 - Probability of damage of electrical and electronic systems due to indirect lightning flashes - investigation of data from German insurance companies N2 - In the presented paper data collected from the field related to damage statistics of electrical and electronic apparatus in household are reported and investigated. These damages (total number approx. 74000 cases), registered by five German insurance companies in 2005 and 2006, were adviced by customers as caused by lightning overvoltages. With the use of stochastical methods it is possible, to reasses the collected data and to distinguish between cases, which are with high probability caused by lightning overvoltages, and those, which are not. If there was an indication for a direct strike, this case was excluded, so the focus was only on indirect lightning flashes, i.e. only flashes to ground near the structure and flashes to or nearby an incoming service line were investigated. The data from the field contain the location of damaged apparatus (residence of the policy holder) and the distances of the nearest cloud-to-ground stroke to the location of the damage registered by the German lightning location network BLIDS at the date of damage. The statistical data along with some complementary numerical simulations allow to verify the correspondence of the Standards rules used for IEC 62305-2 with the field data and to define some correction needs. The results could lead to a better understanding whether a damage reported to an insurance company is really caused by indirect lightning, or not. KW - Blitzschutz KW - lightning flash Y1 - 2009 ER -