TY  - JOUR
A1  - Prume, Klaus
A1  - Gerber, P.
A1  - Roelofs, A.
A1  - Kügeler, C.
T1  - Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; Kügeler, C.;  Böttger, U. ; Waser, R. ; Prume, K. ;
JF  - Journal of Applied Physics  . 96 (2004), H. 5
Y1  - 2004
SN  - 0021-8979
SP  - 2800
EP  - 2804
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Reichenberg, B.
A1  - Roelofs, A.
A1  - Waser, R.
T1  - In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements  / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.
JF  - Journal of the European Ceramic Society. 24 (2004), H. 6
Y1  - 2004
SN  - 0955-2219
N1  - Electroceramics VIII
SP  - 1145
EP  - 1147
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Franken, Klaus
A1  - Böttger, Ulrich
A1  - Waser, Rainer
T1  - Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; Böttger, Ulrich ; Waser, Rainer ; Maier, Horst R.
JF  - Journal of the European Ceramic Society. 22 (2002), H. 8
Y1  - 2002
SN  - 0955-2219
SP  - 1285
EP  - 1296
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Roelofs, Andreas
A1  - Schmitz, Thorsten
A1  - Reichenberg, Bernd
T1  - Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb
JF  - Japanese Journal of Applied Physics. 41 (2002), H. 11B
Y1  - 2002
SN  - 0021-4922
SP  - 7198
EP  - 7201
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Tiedke, S.
A1  - Schmitz, T.
A1  - Roelofs, A.
T1  - Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs
JF  - Applied Physics Letters. 79 (2001), H. 22
Y1  - 2001
SN  - 0003-6951
SP  - 3678
EP  - 3680
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Waser, Rainer
T1  - Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer
JF  - Proceedings of the 2000 12th IEEE International Symposium on  Applications of Ferroelectrics. Vol. 2
Y1  - 2000
N1  - ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on  Applications of Ferroelectrics
SP  - 675
EP  - 678
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Franken, Klaus
A1  - Maier, Horst R.
A1  - Waser, Rainer
T1  - Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer
JF  - Journal of the American Ceramic Society. 83 (2000), H. 6
Y1  - 2000
SN  - 0002-7820
SP  - 1433
EP  - 1440
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Waser, Rainer
A1  - Franken, Klaus
A1  - Maier, Horst R.
T1  - Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;
JF  - Journal of the American Ceramic Society. 83 (2000), H. 5
Y1  - 2000
SN  - 0002-7820
SP  - 1153
EP  - 1159
ER  -