TY  - CHAP
A1  - Stender, Michael
A1  - Ritz, Thomas
ED  - Uhr, Wolfgang
T1  - Überbetriebliche Ad-hoc-Anwendungsintegration im Mobile Business
T2  - Wirtschaftsinformatik 2003 : Medien, Märkte, Mobilität: - Bd. 1
Y1  - 2003
SN  - 3-7908-0111-9
SP  - 103
EP  - 118
PB  - Physica-Verl.
CY  - Heidelberg
ER  - 
TY  - BOOK
A1  - Ritz, Thomas
A1  - Benz, Axel
A1  - Stender, Michael
T1  - Marktstudie mobile CRM-Systeme
Y1  - 2003
SN  - 3-8167-6361-8
PB  - Fraunhofer-IRB-Verl.
CY  - Stuttgart
ER  - 
TY  - CHAP
A1  - Ritz, Thomas
T1  - Production and distribution of personalized information services employing mass customization
T2  - 2nd Interdisciplinary World Congress on Mass Customization and Personalization : MCPC'03, October 6 - 8, 2003, Technische Universität München, Munic, Germany
Y1  - 2003
SP  - Part IV
PB  - Techn. Univ. (TUM)
CY  - München
ET  - CD-Ausg.
ER  - 
TY  - JOUR
A1  - Ritz, Thomas
A1  - Benz, Axel
ED  - Spath, Dieter
T1  - Informationserfassung im Außendienst
JF  - CRM-Systeme in produzierenden Unternehmen. - (IAO-Forum : mit Anwenderberichten)
Y1  - 2004
N1  - Fraunhofer IAO Forum 31. März 2004
VL  - 2004
PB  - IRB-Verl.
CY  - Stuttgart
ER  - 
TY  - JOUR
A1  - Ritz, Thomas
T1  - Mobile CRM-Systeme : Customer Relationship Management zur Unterstützung des Vertriebsaußendienstes
JF  - Zeitschrift für wirtschaftlichen Fabrikbetrieb : ZWF ; Organ des VDI-Kompetenzfeldes Informationstechnik (VDI-KfIT)
Y1  - 2003
SN  - 0932-0482 (Print)
SN  - 0947-0085 (Online)
VL  - 99
IS  - 12
SP  - 699
EP  - 702
ER  - 
TY  - THES
A1  - Ritz, Thomas
T1  - Die werkzeuggestützte Produktion von personalisierten Informationsdienstleistungen. - (IPA-IAO Forschung und Praxis ; 389)
Y1  - 2004
SN  - 3-936947-23-6
N1  - Zugl.: Stuttgart, Univ., Diss., 2003
PB  - Jost-Jetter
CY  - Heimsheim
ER  - 
TY  - JOUR
A1  - Ritz, Thomas
A1  - Stender, Michael
ED  - Weisbecker, Anette
T1  - Ad-hoc Anwendungsintegration mit mobilen CRM-Systement
JF  - Electronic Business : Innovationen, Anwendungen und Technologien
Y1  - 2004
SN  - 3-8167-6621-8
SP  - 92
EP  - 97
PB  - Fraunhofer-IRB-Verl.
CY  - Stuttgart
ER  - 
TY  - BOOK
A1  - Heuermann, Holger
T1  - Sichere Verfahren zur Kalibrierung von Netzwerkanalysatoren fuer koaxiale und planare Leitungssysteme
Y1  - 1996
SN  - 3-8265-1495-5
N1  - Zugl.: Bochum, Univ., Diss., 1995
PB  - Shaker
CY  - Aachen
ER  - 
TY  - BOOK
A1  - Heuermann, Holger
T1  - Hochfrequenztechnik : Lineare Komponenten hochintegrierter Hochfrequenzschaltungen
Y1  - 2005
SN  - 3-528-03980-9
PB  - Vieweg
CY  - Wiesbaden
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Stolle, Reinhard
A1  - Schiek, Burkhard
T1  - Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B.
Y1  - 1995
N1  - Conference proceedings / IEEE NTC '95, the Microwave Systems Conference;  NTC <1995, Orlando, Fla.>
SP  - 129
EP  - 132
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Baumann, F.-M.
A1  - Fauth, G.
A1  - Albert, M.
T1  - Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure
JF  - On-Line Moisture Analysis of Raw Coal
Y1  - 1994
N1  - 1993 International Symposium on On-Line Analysis of Coal : Vienna ; [proceedings].
SP  - 1361
EP  - 1364
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure
Y1  - 1994
N1  - 1994 IEEE MTT-S International Microwave Symposium digest : May 23 - 27, 1994, San Diego Convention Center, San Diego, California / H. J. Kuno, ed.
SP  - 1361
EP  - 1364
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Praezise Streuparametermessungen sind der Schluessel zur Modellierung elektrischer Schaltungen
JF  - Neues von Rohde & Schwarz (1997)
Y1  - 1997
SP  - 22
EP  - 23
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - The double-LNN Calibration technique for scattering parameter measurements of microstrip devices
JF  - Conference proceedings
Y1  - 1995
N1  - European Microwave Conference <25, 1995, Bologna>
SP  - 343
EP  - 347
PB  - NEXUS House
CY  - Kent
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures
Y1  - 1996
N1  - 46th ARFTG conference digest : November 30 - December 1. 1995, Safari Resort, Scottsdale, Arizona / Automatic RF Techniques Group. [Publ. chairman: Ed. Godshalk]
SP  - 136
EP  - 145
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Microwave On-Wafer Measurements with Activ Needle Probe Tips
Y1  - 1997
N1  - 47th ARFTG Conference digest : June 20 - 21, 1996, Moscone Convention Center, San Francisco, California / Automatic RF Techniques Group. [Publication chair: Ed Godshalk
SP  - 208
EP  - 214
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements
Y1  - 1995
N1  - 45th ARFTG Conference digest, Spring 1995 : [conference topic: Testing and design of RFIC'S], May 19, 1995, Orange County Convention Center, Orlando, Florida / Automatic RF Techniques Group. Publications chairman: Ed Godshalk;  ARFTG Conference digest ; 4
SP  - 129
EP  - 136
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique
JF  - Conference proceedings : [Palais des Festivals et des Congrès Cannes, France, 5 - 8 September 1994]
Y1  - 1994
SN  - 0-9518032-5-5
N1  - European Microwave Conference <24, 1994, Cannes>
PB  - Nexus Business Communications
CY  - Swanley
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - The In-Fixture Calibration Procedure Line-Network-Network-LNN
JF  - Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community]
Y1  - 1992
SN  - 0-946821-23-2
N1  - European Microwave Conference <23, 1993, Madrid>
SP  - 500
EP  - 505
PB  - Reed Exhibition Companies
CY  - Tunbridge Wells
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - A Fast and Robust Procedure for the Determination of the Scattering Parameters for Network Analyzer Calibration
Y1  - 1992
N1  - Precision electromagnetic measurements : conference Paris, 9-12 June 1992 = Conférence sur les Mesures Electromagnétiques de Précision.
SP  - 373
EP  - 374
CY  - Paris
ER  -