TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - A Fast and Robust Procedure for the Determination of the Scattering Parameters for Network Analyzer Calibration Y1 - 1992 N1 - Precision electromagnetic measurements : conference Paris, 9-12 June 1992 = Conférence sur les Mesures Electromagnétiques de Précision. SP - 373 EP - 374 CY - Paris ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Error Corrected Impedance Measurements with a Network Analyzer Y1 - 1994 N1 - 1994 Conference on Precision Electromagnetic Measurements digest : 27 June - 1 July 1994, Boulder, Colorado, USA / Organized by National Institute of Standards and Technology. Ed. by Edie DeWeese SP - 125 EP - 126 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - A Generalization of the Txx Network Analyzer Self-Calibration Procedure JF - Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2 Y1 - 1992 SN - 0-946821-77-1 N1 - European Microwave Conference <22, 1992, Espoo> ; Teknillinen Korkeakoulu SP - 907 EP - 912 PB - Microwave Exhibitions and Publishers CY - Tunbridge Wells ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - The In-Fixture Calibration Procedure Line-Network-Network-LNN JF - Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community] Y1 - 1992 SN - 0-946821-23-2 N1 - European Microwave Conference <23, 1993, Madrid> SP - 500 EP - 505 PB - Reed Exhibition Companies CY - Tunbridge Wells ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique JF - Conference proceedings : [Palais des Festivals et des Congrès Cannes, France, 5 - 8 September 1994] Y1 - 1994 SN - 0-9518032-5-5 N1 - European Microwave Conference <24, 1994, Cannes> PB - Nexus Business Communications CY - Swanley ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - The double-LNN Calibration technique for scattering parameter measurements of microstrip devices JF - Conference proceedings Y1 - 1995 N1 - European Microwave Conference <25, 1995, Bologna> SP - 343 EP - 347 PB - NEXUS House CY - Kent ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure Y1 - 1994 N1 - 1994 IEEE MTT-S International Microwave Symposium digest : May 23 - 27, 1994, San Diego Convention Center, San Diego, California / H. J. Kuno, ed. SP - 1361 EP - 1364 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Procedures for the Determination of the Scattering Parameters for Network Analyzer Calibration JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2 Y1 - 1993 SN - 0018-9456 SP - 528 EP - 531 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1 Y1 - 1994 SN - 0018-9456 SP - 18 EP - 23 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Error corrected impedance measurements with a network analyzer JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2 Y1 - 1995 SN - 0018-9456 SP - 295 EP - 299 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1120 EP - 1127 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - 15-term self-calibration methods for the error-correction of on-wafer measurements JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1105 EP - 1110 ER - TY - JOUR A1 - Heuermann, Holger A1 - Sadeghfam, Arash A1 - Boehm, H. T1 - Ultra Compact Multi-Mode Filter with Novel Rat-Race Inductor. Sadeghfam, Arash; Heuermann, Holger; Boehm, H. JF - Conference proceedings : 3 - 7 October 2005, CNIT la Défense, Paris, France; [comprises the] 35th European Microwave Conference 2005 ; The European Conference on Wireless Technology 2005 ; European Radar Conference 2005 ; GAAS 2005, The European Gallium A. Vol. 2 Y1 - 2005 SN - 2-9600551-0-1 N1 - European Microwave Conference ; (35, 2005, Paris) ; European Microwave Week ; (2005, Paris) SP - 4 pp. PB - Horizon House Publ CY - London ER - TY - JOUR A1 - Heuermann, Holger A1 - Sadeghfam, Arash T1 - Novel balanced inductor for compact differential systems / Sadeghfam, Arash; Heuermann, Holger JF - Conference proceedings : Tuesday 12th, Wednesday 13th and Thursday 14th October, [RAI International Exhibition and Congress Centre, Amsterdam ; part of European Microwave Week 2004] / EuMA, European Microwave Association Y1 - 2004 SN - 1-580-53992-0 N1 - European Microwave Conference ; (34, 2004, Amsterdam) ; European Microwave Week ; (7, 2004, Amsterdam) SP - 709 EP - 712 PB - Horizon House Publ. CY - London ER - TY - JOUR A1 - Heuermann, Holger A1 - Sadeghfam, Arash T1 - Electrically tunable bandpass filter with integrated carrier suppression for UHF RFID systems / Sadeghfam, Arash ; Heuermann, Holger JF - European Microwave Conference, 2008, EuMC 2008, 38th Y1 - 2008 SN - 978-2-87487-006-4 SP - 1727 EP - 1730 ER - TY - JOUR A1 - Heuermann, Holger A1 - Sadeghfam, Arash T1 - On the design of multimode integrated circuits in multilayered processes / Sadeghfam, A. ; Heuermann, H. JF - European Microwave Conference, 2007, 9-12 Oct. 2007 Y1 - 2007 SN - 978-2-87487-001-9 N1 - EuMC 2007 ; European Microwave Conference ; (37 : ; 2007.10.09-12 : ; Munich) SP - 516 EP - 519 ER - TY - JOUR A1 - Heuermann, Holger A1 - Sadeghfam, Arash T1 - Electrically tunable bandpass filter with integrated carrier suppression for UHF RFID systems / Sadeghfam, Arash ; Heuermann, Holger JF - European Conference on Wireless Technology, 2008. EuWiT 2008. Y1 - 2008 SN - 978-2-87487-008-8 SP - 306 EP - 309 ER - TY - JOUR A1 - Heuermann, Holger A1 - Sadeghfam, A. T1 - Enhanced system architecture for rugged wide band data transmission / Sadeghfam, A. ; Heuermann, H. JF - European Radar Conference, 2009 : EuRAD 2009 ; Sept. 30 - Oct. 2 2009, Rome, Italy ; part of the European Microwave Week (EuMW) / sponsored by EuMA, European Microwave Association Y1 - 2009 SN - 978-2-87487-014-9 N1 - Proceedings of the 6th European Radar Conference SP - 347 EP - 350 PB - IEEE CY - Piscataway, NJ ER - TY - JOUR A1 - Heuermann, Holger A1 - Rumiantsev, A. A1 - Schott, S. T1 - Advanced on-wafer multiport calibration methods for mono- and mixed-mode device characterization JF - On wafer characterization : 63rd ARFTG conference digest, spring 2004, 11 June 2004, Fort Worth, TX / Automatic RF Techniques Group. [Conference chair: John Cable. Publication chair: J. G. Burns] Y1 - 2004 SN - 0-7803-8371-0 N1 - Microwave Theory and Techniques Society. ; Automatic RF Techniques Group ; ARFTG conference ; (63 : ; 2004.06.11 : ; Fort Worth, Tex.) SP - 91 EP - 96 PB - IEEE Operations Center CY - Piscataway, NJ ER - TY - JOUR A1 - Heuermann, Holger A1 - Peters, N. A1 - Schmitz, T. A1 - Sadeghfam, Arash T1 - Concept of Balanced Antennas with Load-Invariant Base Impedance Using a Two Element LC-Coupler. Peters, N., Schmitz, Th., Sadeghfam, A., Heuermann, H. JF - Proceedings of the European microwave association : journal of the European microwave association Y1 - 2005 SP - 117 EP - 122 PB - PLUS CY - Pisa ER -