TY  - JOUR
A1  - Prume, Klaus
A1  - Meyer, René
A1  - Waser, Rainer
A1  - Schmitz, Torsten
T1  - Dynamic leakage current compensation in ferroelectric thin-film capacitor structures / Meyer, René ; Waser, Rainer ; Prume, Klaus ; Schmitz, Torsten ; Tiedke, Stephan
JF  - Applied Physics Letters . 86 (2005), H. 14
Y1  - 2005
SN  - 0003-6951
SP  - 142907-1
EP  - 142907-3
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Franken, Klaus
A1  - Maier, Horst R.
A1  - Waser, Rainer
T1  - Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer
JF  - Journal of the American Ceramic Society. 83 (2000), H. 6
Y1  - 2000
SN  - 0002-7820
SP  - 1433
EP  - 1440
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Waser, Rainer
A1  - Franken, Klaus
A1  - Maier, Horst R.
T1  - Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;
JF  - Journal of the American Ceramic Society. 83 (2000), H. 5
Y1  - 2000
SN  - 0002-7820
SP  - 1153
EP  - 1159
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Reichenberg, B.
A1  - Roelofs, A.
A1  - Waser, R.
T1  - In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements  / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.
JF  - Journal of the European Ceramic Society. 24 (2004), H. 6
Y1  - 2004
SN  - 0955-2219
N1  - Electroceramics VIII
SP  - 1145
EP  - 1147
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Waser, Rainer
T1  - Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer
JF  - Proceedings of the 2000 12th IEEE International Symposium on  Applications of Ferroelectrics. Vol. 2
Y1  - 2000
N1  - ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on  Applications of Ferroelectrics
SP  - 675
EP  - 678
ER  - 
TY  - JOUR
A1  - Prume, Klaus
T1  - Electrical and electromechanical characterization of piezoelectric thin films in view of MEMS application  /  Tiedke, S. ; Prume, K. ; Schmitz-Kempen, T.;
Y1  - 2007
N1  - ISAF 2007. Sixteenth IEEE International Symposium on  Applications of Ferroelectrics, 2007
SP  - 702
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Muralt, P.
A1  - Calame, F.
A1  - Schmitz-Kempen, T.
T1  - Piezoelectric thin films: evaluation of electrical and electromechanical characteristics for MEMS devices  / Prume, K. ; Muralt, P. ; Calame, F. ; Schmitz-Kempen, T. ; Tiedke, S. ;
JF  - IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control. 54 (2007), H. 1
Y1  - 2007
SN  - 0885-3010
SP  - 81
EP  - 14
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Tiedke, S.
A1  - Schmitz, T.
A1  - Roelofs, A.
T1  - Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs
JF  - Applied Physics Letters. 79 (2001), H. 22
Y1  - 2001
SN  - 0003-6951
SP  - 3678
EP  - 3680
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Gerber, P.
A1  - Roelofs, A.
A1  - Kügeler, C.
T1  - Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; Kügeler, C.;  Böttger, U. ; Waser, R. ; Prume, K. ;
JF  - Journal of Applied Physics  . 96 (2004), H. 5
Y1  - 2004
SN  - 0021-8979
SP  - 2800
EP  - 2804
ER  - 
TY  - BOOK
A1  - Prume, Klaus
T1  - Modellierung und Simulation der elektrisch-thermisch-mechanisch gekoppelten Eigenschaften keramischer Vielschichtstrukturen
Y1  - 2001
SN  - 3-8265-8309-4
N1  - Zugl.: Aachen, Techn. Hochschul., Diss., 2001; Berichte aus der Elektrotechnik
PB  - Shaker
CY  - Aachen
ER  -